P

Inventor

YUAN CHUNG-SHENG

TW10 patents
⚠️ This page may combine multiple inventors who share the name “YUAN CHUNG-SHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

6 patents
US11585831B2Feb 21, 2023

Test probing structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12411508B2Sep 9, 2025

Semiconductor devices including voltage monitors

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12578386B2Mar 17, 2026

Scan chain control

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10782318B2Sep 22, 2020

Test probing structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9613174B2Apr 4, 2017

Common template for electronic article

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9952279B2Apr 24, 2018

Apparatus for three dimensional integrated circuit testing

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations38

BAVISKAR DINESH

1 patent
US8276110B2Sep 25, 2012

Reducing voltage drops in power networks using unused spaces in integrated circuits

BAVISKAR DINESH12 citations76

WANG MILL-JER

1 patent
US9817029B2Nov 14, 2017

Test probing structure

WANG MILL-JER4 citations72

GOEL SANDEEP KUMAR

1 patent
US9704766B2Jul 11, 2017

Interposers of 3-dimensional integrated circuit package systems and methods of designing the same

GOEL SANDEEP KUMAR2 citations72

TAIWAN SEMICONDUCTOR MFG

1 patent
US9003338B2Apr 7, 2015

Common template for electronic article

TAIWAN SEMICONDUCTOR MFG2 citations62