P

Inventor

OTAKI TATSURO

JP20 patents

Patents

20 patents
US6160662ADec 12, 2000

Inverted microscope having a variable stage position

NIKON CORP61 citations94
US6657787B1Dec 2, 2003

Contrast improvement optical apparatus and method

NIKON CORP24 citations92
US6317261B1Nov 13, 2001

Phase contrast observation device

NIKON CORP30 citations92
US5808790ASep 15, 1998

Integrated microscope providing near-field and light microscopy

NIKON CORP25 citations92
US5764408AJun 9, 1998

Lens-barrel optical system and microscope apparatus

NIKON CORP25 citations92
US5657166AAug 12, 1997

Condenser lens system for use in a microscope

NIKON CORP25 citations92
US5572359ANov 5, 1996

Differential interference microscope apparatus and an observing method using the same apparatus

NIKON CORP44 citations92
US6091911AJul 18, 2000

Microscope photographing unit with brightness control for observation optical system

NIKON CORP28 citations90
US6128128AOct 3, 2000

Microscope system

NIKON CORP17 citations82
US5880455AMar 9, 1999

Focal position detection apparatus having a light reflecting member with plural reflecting films

NIKON CORP17 citations82
US5847866ADec 8, 1998

Lens-barrel optical system and microscope apparatus

NIKON CORP10 citations73
US5699197ADec 16, 1997

Microscope with a condenser lens system having a tapered portion

NIKON CORP8 citations73
US6178294B1Jan 23, 2001

Photographing unit for a microscope

NIKON CORP9 citations71
US5802406ASep 1, 1998

Focusing glass and photographic system

NIKON CORP8 citations71
US8558996B2Oct 15, 2013

Wavefront aberration measuring apparatus

NIKON CORP3 citations62
US5717520AFeb 10, 1998

Intermediate lens barrel for microscope

NIKON CORP4 citations62
US7092151B2Aug 15, 2006

Microscope having a pipette device

NIKON CORP3 citations61
US5687416ANov 11, 1997

Photographic apparatus with selectable photometric optical systems

NIKON CORP3 citations61
US8687179B2Apr 1, 2014

Wavefront aberration measuring apparatus

NIKON CORP0 citations52
US6549334B1Apr 15, 2003

Transmission illumination type differential interference microscope

NIKON CORP0 citations37