Inventor
SOTTERY JOHN PHELPS
US2 patents
Patents
2 patentsUS7193712B2Mar 20, 2007
Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate
INNOVATIVE MEASUREMENT SOLUTIO11 citations78
US7274453B2Sep 25, 2007
Methods and apparatus for calibrating an electromagnetic measurement device
INNOVATIVE MEASUREMENT SOLUTIO9 citations64