Inventor

LYONSMITH SHAWN D

US17 patents

⚠️ This page may combine multiple inventors who share the name “LYONSMITH SHAWN D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LYONSMITH SHAWN D

MICRON TECHNOLOGY INC

Method of forming biasable isolation regions using epitaxially grown silicon between the isolation regions

Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging

Electron induced chemical etching/deposition for enhanced detection of surface defects

Non-contact measurement of memory cell threshold voltage

Non-contact electron beam probing techniques and related structures

Non-contact electron beam probing techniques and related structures

Semiconductor device having a stack of data lines with conductive structures on both sides thereof

Biasable isolation regions using epitaxially grown silicon between the isolation regions

Memory device including multiple decks of memory cells and pillars extending through the decks

System for predicting properties of structures, imager system, and related methods

System for predicting properties of structures, imager system, and related methods

Non-contact measurement of memory cell threshold voltage

System for predicting properties of structures, imager system, and related methods

LODESTAR LICENSING GROUP LLC

Method for manufacturing a memory structure having stacked data lines and conductive structures on sides thereof

Memory device including multiple decks of memory cells and pillars extending through the decks

DAYCOCK DAVID A

Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate

Method of reducing electron beam damage on post W-CMP wafers