Inventor
KAHNG ANDREW B
US32 patents
⚠️ This page may combine multiple inventors who share the name “KAHNG ANDREW B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TELA INNOVATIONS INC
10 patentsUS7640522B2Dec 29, 2009
Method and system for placing layout objects in a standard-cell layout
TELA INNOVATIONS INC110 citations98
US7814456B2Oct 12, 2010
Method and system for topography-aware reticle enhancement
TELA INNOVATIONS INC21 citations93
US7743349B2Jun 22, 2010
Method and system for finding an equivalent circuit representation for one or more elements in an integrated circuit
TELA INNOVATIONS INC28 citations93
US9069926B2Jun 30, 2015
Standard cells having transistors annotated for gate-length biasing
TELA INNOVATIONS INC1 citations63
US7627849B1Dec 1, 2009
System and method for varying the starting conditions for a resolution enhancement program to improve the probability that design goals will be met
TELA INNOVATIONS INC3 citations63
US7865856B1Jan 4, 2011
System and method for performing transistor-level static performance analysis using cell-level static analysis tools
TELA INNOVATIONS INC3 citations60
US7745239B1Jun 29, 2010
Arrangement of fill unit elements in an integrated circuit interconnect layer
TELA INNOVATIONS INC5 citations58
US7676772B1Mar 9, 2010
Layout description having enhanced fill annotation
TELA INNOVATIONS INC6 citations57
US7823098B1Oct 26, 2010
Method of designing a digital circuit by correlating different static timing analyzers
TELA INNOVATIONS INC4 citations56
US9202003B2Dec 1, 2015
Gate-length biasing for digital circuit optimization
TELA INNOVATIONS INC0 citations52
GUPTA PUNEET
7 patentsUS8185865B2May 22, 2012
Methods for gate-length biasing using annotation data
GUPTA PUNEET114 citations99
US8490043B2Jul 16, 2013
Standard cells having transistors annotated for gate-length biasing
GUPTA PUNEET16 citations92
US8127266B1Feb 28, 2012
Gate-length biasing for digital circuit optimization
GUPTA PUNEET22 citations92
US8635583B2Jan 21, 2014
Standard cells having transistors annotated for gate-length biasing
GUPTA PUNEET6 citations84
US8756555B2Jun 17, 2014
Standard cells having transistors annotated for gate-length biasing
GUPTA PUNEET3 citations74
US8949768B2Feb 3, 2015
Standard cells having transistors annotated for gate-length biasing
GUPTA PUNEET1 citations63
US8869094B2Oct 21, 2014
Standard cells having transistors annotated for gate-length biasing
GUPTA PUNEET0 citations52
UNIV CALIFORNIA
7 patentsUS7873929B2Jan 18, 2011
Method, apparatus and system for designing an integrated circuit including generating at least one auxiliary pattern for cell-based optical proximity correction
UNIV CALIFORNIA157 citations99
US8751974B2Jun 10, 2014
Layout decomposition for double patterning lithography
UNIV CALIFORNIA22 citations91
US7062743B2Jun 13, 2006
Floorplan evaluation, global routing, and buffer insertion for integrated circuits
UNIV CALIFORNIA41 citations87
US7945870B2May 17, 2011
Method and apparatus for detecting lithographic hotspots in a circuit layout
UNIV CALIFORNIA7 citations84
US9922161B2Mar 20, 2018
IC layout adjustment method and tool for improving dielectric reliability at interconnects
UNIV CALIFORNIA15 citations80
US10713406B2Jul 14, 2020
Multi-die IC layout methods with awareness of mix and match die integration
UNIV CALIFORNIA3 citations72
US6047117AApr 4, 2000
Diffusion-based method and apparatus for determining circuit interconnect voltage response
UNIV CALIFORNIA6 citations63