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Inventor

GAMBEE CHRISTOPHER J

US24 patents
⚠️ This page may combine multiple inventors who share the name “GAMBEE CHRISTOPHER J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

21 patents
US10332792B1Jun 25, 2019

Methods of fabricating conductive traces and resulting structures

MICRON TECHNOLOGY INC5 citations83
US9299663B2Mar 29, 2016

Semiconductor devices and methods for backside photo alignment

MICRON TECHNOLOGY INC10 citations80
US9318438B2Apr 19, 2016

Semiconductor structures comprising at least one through-substrate via filled with conductive materials

MICRON TECHNOLOGY INC4 citations71
US7402908B2Jul 22, 2008

Intermediate semiconductor device structures

MICRON TECHNOLOGY INC6 citations71
US10002840B1Jun 19, 2018

Semiconductor devices having discretely located passivation material, and associated systems and methods

MICRON TECHNOLOGY INC3 citations70
US9704781B2Jul 11, 2017

Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods

MICRON TECHNOLOGY INC3 citations70
US9741612B2Aug 22, 2017

Semiconductor devices and methods for backside photo alignment

MICRON TECHNOLOGY INC2 citations69
US11302653B2Apr 12, 2022

Die features for self-alignment during die bonding

MICRON TECHNOLOGY INC0 citations62
US10748857B2Aug 18, 2020

Die features for self-alignment during die bonding

MICRON TECHNOLOGY INC1 citations62
US9129869B2Sep 8, 2015

Pillar on pad interconnect structures, semiconductor devices including same and related methods

MICRON TECHNOLOGY INC2 citations62
US11094684B2Aug 17, 2021

Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography

MICRON TECHNOLOGY INC0 citations60
US10923478B2Feb 16, 2021

Reduction of roughness on a sidewall of an opening

MICRON TECHNOLOGY INC1 citations60
US8008196B2Aug 30, 2011

Method to create a metal pattern using a damascene-like process

MICRON TECHNOLOGY INC2 citations60
US11276658B2Mar 15, 2022

Devices with three-dimensional structures and support elements to increase adhesion to substrates

MICRON TECHNOLOGY INC0 citations59
US10896886B2Jan 19, 2021

Semiconductor devices having discretely located passivation material, and associated systems and methods

MICRON TECHNOLOGY INC0 citations59
US10790251B2Sep 29, 2020

Methods for enhancing adhesion of three-dimensional structures to substrates

MICRON TECHNOLOGY INC1 citations59
US10811313B2Oct 20, 2020

Methods of fabricating conductive traces and resulting structures

MICRON TECHNOLOGY INC0 citations51
US9034769B2May 19, 2015

Methods of selectively removing a substrate material

MICRON TECHNOLOGY INC1 citations50
US10403618B2Sep 3, 2019

Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography

MICRON TECHNOLOGY INC0 citations49
US10262961B2Apr 16, 2019

Semiconductor devices having discretely located passivation material, and associated systems and methods

MICRON TECHNOLOGY INC0 citations49
US9966347B2May 8, 2018

Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods

MICRON TECHNOLOGY INC0 citations49

GAMBEE CHRISTOPHER J

2 patents

FAY OWEN R

1 patent