Inventor
GAMBEE CHRISTOPHER J
US24 patents
⚠️ This page may combine multiple inventors who share the name “GAMBEE CHRISTOPHER J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
21 patentsUS10332792B1Jun 25, 2019
Methods of fabricating conductive traces and resulting structures
MICRON TECHNOLOGY INC5 citations83
US9299663B2Mar 29, 2016
Semiconductor devices and methods for backside photo alignment
MICRON TECHNOLOGY INC10 citations80
US9318438B2Apr 19, 2016
Semiconductor structures comprising at least one through-substrate via filled with conductive materials
MICRON TECHNOLOGY INC4 citations71
US7402908B2Jul 22, 2008
Intermediate semiconductor device structures
MICRON TECHNOLOGY INC6 citations71
US10002840B1Jun 19, 2018
Semiconductor devices having discretely located passivation material, and associated systems and methods
MICRON TECHNOLOGY INC3 citations70
US9704781B2Jul 11, 2017
Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods
MICRON TECHNOLOGY INC3 citations70
US9741612B2Aug 22, 2017
Semiconductor devices and methods for backside photo alignment
MICRON TECHNOLOGY INC2 citations69
US11302653B2Apr 12, 2022
Die features for self-alignment during die bonding
MICRON TECHNOLOGY INC0 citations62
US10748857B2Aug 18, 2020
Die features for self-alignment during die bonding
MICRON TECHNOLOGY INC1 citations62
US9129869B2Sep 8, 2015
Pillar on pad interconnect structures, semiconductor devices including same and related methods
MICRON TECHNOLOGY INC2 citations62
US11094684B2Aug 17, 2021
Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography
MICRON TECHNOLOGY INC0 citations60
US10923478B2Feb 16, 2021
Reduction of roughness on a sidewall of an opening
MICRON TECHNOLOGY INC1 citations60
US8008196B2Aug 30, 2011
Method to create a metal pattern using a damascene-like process
MICRON TECHNOLOGY INC2 citations60
US11276658B2Mar 15, 2022
Devices with three-dimensional structures and support elements to increase adhesion to substrates
MICRON TECHNOLOGY INC0 citations59
US10896886B2Jan 19, 2021
Semiconductor devices having discretely located passivation material, and associated systems and methods
MICRON TECHNOLOGY INC0 citations59
US10790251B2Sep 29, 2020
Methods for enhancing adhesion of three-dimensional structures to substrates
MICRON TECHNOLOGY INC1 citations59
US10811313B2Oct 20, 2020
Methods of fabricating conductive traces and resulting structures
MICRON TECHNOLOGY INC0 citations51
US9034769B2May 19, 2015
Methods of selectively removing a substrate material
MICRON TECHNOLOGY INC1 citations50
US10403618B2Sep 3, 2019
Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography
MICRON TECHNOLOGY INC0 citations49
US10262961B2Apr 16, 2019
Semiconductor devices having discretely located passivation material, and associated systems and methods
MICRON TECHNOLOGY INC0 citations49
US9966347B2May 8, 2018
Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods
MICRON TECHNOLOGY INC0 citations49