Inventor
PARAT KRISHNA
US42 patents
⚠️ This page may combine multiple inventors who share the name “PARAT KRISHNA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
20 patentsUS6518618B1Feb 11, 2003
Integrated memory cell and method of fabrication
INTEL CORP131 citations98
US5835328ANov 10, 1998
Breakdown-tiggered transient discharge circuit
INTEL CORP55 citations96
US6265292B1Jul 24, 2001
Method of fabrication of a novel flash integrated circuit
INTEL CORP81 citations93
US6949801B2Sep 27, 2005
Dual trench isolation using single critical lithographic patterning
INTEL CORP16 citations92
US6943071B2Sep 13, 2005
Integrated memory cell and method of fabrication
INTEL CORP21 citations92
US6849518B2Feb 1, 2005
Dual trench isolation using single critical lithographic patterning
INTEL CORP15 citations84
US10923450B2Feb 16, 2021
Memory arrays with bonded and shared logic circuitry
INTEL CORP4 citations73
US7183162B1Feb 27, 2007
Method of forming non-volatile memory cell using sacrificial pillar spacers and non-volatile memory cell formed according to the method
INTEL CORP8 citations73
US11625191B2Apr 11, 2023
Apparatuses, systems, and methods for heating a memory device
INTEL CORP2 citations72
US11322508B2May 3, 2022
Flash memory components and methods
INTEL CORP1 citations63
US7187591B2Mar 6, 2007
Memory device and method for erasing memory
INTEL CORP6 citations63
US7835187B2Nov 16, 2010
Boosting seed voltage for a memory device
INTEL CORP5 citations62
US10784274B1Sep 22, 2020
3-dimensional flash memory with increased floating gate length
INTEL CORP1 citations61
US7920419B2Apr 5, 2011
Isolated P-well architecture for a memory device
INTEL CORP2 citations61
US7989289B2Aug 2, 2011
Floating gate structures
INTEL CORP5 citations60
US11355199B2Jun 7, 2022
Method and apparatus to mitigate hot electron read disturbs in 3D NAND devices
INTEL CORP0 citations59
US10622450B2Apr 14, 2020
Modified floating gate and dielectric layer geometry in 3D memory arrays
INTEL CORP1 citations59
US10861867B2Dec 8, 2020
Memory device with reduced capacitance
INTEL CORP0 citations52
US10854746B2Dec 1, 2020
Channel conductivity in memory structures
INTEL CORP0 citations52
US7582530B2Sep 1, 2009
Managing floating gate-to-floating gate spacing to support scalability
INTEL CORP0 citations40
MICRON TECHNOLOGY INC
10 patentsUS7990772B2Aug 2, 2011
Memory device having improved programming operation
MICRON TECHNOLOGY INC7 citations83
US10438672B2Oct 8, 2019
Memory devices and apparatus configured to apply positive voltage levels to data lines for memory cells selected for and inhibited from programming
MICRON TECHNOLOGY INC1 citations73
US9437304B2Sep 6, 2016
Memory devices and programming memory arrays thereof
MICRON TECHNOLOGY INC4 citations73
US11029861B2Jun 8, 2021
Sense flags in a memory device
MICRON TECHNOLOGY INC0 citations62
US10847233B2Nov 24, 2020
Memory devices and apparatus configured to apply positive voltage levels to data lines for memory cells selected for and inhibited from programming
MICRON TECHNOLOGY INC0 citations52
US10409506B2Sep 10, 2019
Sense flags in a memory device
MICRON TECHNOLOGY INC0 citations52
US10126967B2Nov 13, 2018
Sense operation flags in a memory device
MICRON TECHNOLOGY INC0 citations52
US10049756B2Aug 14, 2018
Memory devices that apply a programming potential to a memory cell in a string coupled to a source and data line concurrently with biasing the data line to a greater potential than the source
MICRON TECHNOLOGY INC0 citations52
US9646702B2May 9, 2017
Operating memory devices to apply a programming potential to a memory cell in a string coupled to a source and data line concurrently with biasing the data line to a greater potential than the source
MICRON TECHNOLOGY INC0 citations52
US9519582B2Dec 13, 2016
Sense operation flags in a memory device
MICRON TECHNOLOGY INC0 citations52
GODA AKIRA
4 patentsUS8174893B2May 8, 2012
Independent well bias management in a memory device
GODA AKIRA10 citations83
US9251907B2Feb 2, 2016
Memory devices and methods of operating memory devices including applying a potential to a source and a select gate between the source and a string of memory cells while performing a program operation on a memory cell in the string
GODA AKIRA3 citations73
US9171626B2Oct 27, 2015
Memory devices and programming memory arrays thereof
GODA AKIRA2 citations63
US8498159B2Jul 30, 2013
Independent well bias management in a memory device
GODA AKIRA0 citations51
Intel NDTM US LLC
4 patentsUS12051469B2Jul 30, 2024
Method and apparatus to mitigate hot electron read disturbs in 3D nand devices
Intel NDTM US LLC0 citations59
US12131785B2Oct 29, 2024
Weak erase pulse
Intel NDTM US LLC0 citations58
US12424483B2Sep 23, 2025
3D NAND with inter-wordline airgap
Intel NDTM US LLC0 citations54
US12120878B2Oct 15, 2024
Block-to-block isolation and deep contact using pillars in a memory array
Intel NDTM US LLC0 citations50