Inventor
HU ZHENYU
US56 patents
⚠️ This page may combine multiple inventors who share the name “HU ZHENYU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
28 patentsUS9653583B1May 16, 2017
Methods of forming diffusion breaks on integrated circuit products comprised of finFET devices
GLOBALFOUNDRIES INC79 citations98
US9064932B1Jun 23, 2015
Methods of forming gate structures by a gate-cut-last process and the resulting structures
GLOBALFOUNDRIES INC109 citations97
US8846491B1Sep 30, 2014
Forming a diffusion break during a RMG process
GLOBALFOUNDRIES INC97 citations97
US10083874B1Sep 25, 2018
Gate cut method
GLOBALFOUNDRIES INC38 citations94
US9455198B1Sep 27, 2016
Methods of removing fins so as to form isolation structures on products that include FinFET semiconductor devices
GLOBALFOUNDRIES INC51 citations94
US9406676B2Aug 2, 2016
Method for forming single diffusion breaks between finFET devices and the resulting devices
GLOBALFOUNDRIES INC41 citations94
US9935104B1Apr 3, 2018
Fin-type field effect transistors with single-diffusion breaks and method
GLOBALFOUNDRIES INC16 citations93
US9553194B1Jan 24, 2017
Method for improved fin profile
GLOBALFOUNDRIES INC19 citations92
US10326002B1Jun 18, 2019
Self-aligned gate contact and cross-coupling contact formation
GLOBALFOUNDRIES INC11 citations84
US10090382B1Oct 2, 2018
Integrated circuit structure including single diffusion break and end isolation region, and methods of forming same
GLOBALFOUNDRIES INC14 citations84
US9947769B1Apr 17, 2018
Multiple-layer spacers for field-effect transistors
GLOBALFOUNDRIES INC14 citations84
US9373535B2Jun 21, 2016
T-shaped fin isolation region and methods of fabrication
GLOBALFOUNDRIES INC7 citations84
US10396206B2Aug 27, 2019
Gate cut method
GLOBALFOUNDRIES INC7 citations83
US10559656B2Feb 11, 2020
Wrap-all-around contact for nanosheet-FET and method of forming same
GLOBALFOUNDRIES INC8 citations82
US10192746B1Jan 29, 2019
STI inner spacer to mitigate SDB loading
GLOBALFOUNDRIES INC12 citations80
US10475890B2Nov 12, 2019
Scaled memory structures or other logic devices with middle of the line cuts
GLOBALFOUNDRIES INC2 citations73
US10121788B1Nov 6, 2018
Fin-type field effect transistors with single-diffusion breaks and method
GLOBALFOUNDRIES INC2 citations73
US10083873B1Sep 25, 2018
Semiconductor structure with uniform gate heights
GLOBALFOUNDRIES INC5 citations73
US10056486B2Aug 21, 2018
Methods for fin thinning providing improved SCE and S/D EPI growth
GLOBALFOUNDRIES INC2 citations73
US10043713B1Aug 7, 2018
Method to reduce FinFET short channel gate height
GLOBALFOUNDRIES INC4 citations73
US8987083B1Mar 24, 2015
Uniform gate height for semiconductor structure with N and P type fins
GLOBALFOUNDRIES INC4 citations73
US10825897B2Nov 3, 2020
Formation of enhanced faceted raised source/drain EPI material for transistor devices
GLOBALFOUNDRIES INC2 citations72
US10777642B2Sep 15, 2020
Formation of enhanced faceted raised source/drain epi material for transistor devices
GLOBALFOUNDRIES INC2 citations72
US9219002B2Dec 22, 2015
Overlay performance for a fin field effect transistor device
GLOBALFOUNDRIES INC6 citations72
US9293586B2Mar 22, 2016
Epitaxial block layer for a fin field effect transistor device
GLOBALFOUNDRIES INC4 citations71
US9362176B2Jun 7, 2016
Uniform exposed raised structures for non-planar semiconductor devices
GLOBALFOUNDRIES INC2 citations63
US10643900B2May 5, 2020
Method to reduce FinFET short channel gate height
GLOBALFOUNDRIES INC0 citations52
US10431665B2Oct 1, 2019
Multiple-layer spacers for field-effect transistors
GLOBALFOUNDRIES INC0 citations52
GLOBALFOUNDRIES US INC
16 patentsUS11888031B2Jan 30, 2024
Fin-based lateral bipolar junction transistor and method
GLOBALFOUNDRIES US INC2 citations73
US11705508B2Jul 18, 2023
Single fin structures
GLOBALFOUNDRIES US INC2 citations73
US11127842B2Sep 21, 2021
Single fin structures
GLOBALFOUNDRIES US INC4 citations73
US10957578B2Mar 23, 2021
Single diffusion break device for FDSOI
GLOBALFOUNDRIES US INC2 citations73
US12495575B2Dec 9, 2025
Multi-channel replacement metal gate device
GLOBALFOUNDRIES US INC0 citations63
US12261215B2Mar 25, 2025
Fin on silicon-on-insulator
GLOBALFOUNDRIES US INC0 citations63
US12107154B2Oct 1, 2024
Single fin structures
GLOBALFOUNDRIES US INC0 citations63
US11784224B2Oct 10, 2023
Lateral bipolar transistor structure with base over semiconductor buffer and related method
GLOBALFOUNDRIES US INC0 citations63
US12159926B2Dec 3, 2024
Lateral bipolar transistor
GLOBALFOUNDRIES US INC0 citations62
US11908898B2Feb 20, 2024
Lateral bipolar transistor structure with base layer of varying horizontal width and methods to form same
GLOBALFOUNDRIES US INC0 citations62
US11810969B2Nov 7, 2023
Lateral bipolar transistor
GLOBALFOUNDRIES US INC0 citations62
US12389627B2Aug 12, 2025
Silicon germanium fins and integration methods
GLOBALFOUNDRIES US INC0 citations52
US12364000B1Jul 15, 2025
Device structures for a high-voltage semiconductor device
GLOBALFOUNDRIES US INC0 citations52
US12272740B2Apr 8, 2025
Bipolar junction transistors with a nanosheet intrinsic base
GLOBALFOUNDRIES US INC0 citations52
US12205949B1Jan 21, 2025
High-voltage semiconductor device structures
GLOBALFOUNDRIES US INC0 citations52
US11264470B2Mar 1, 2022
Lateral bipolar junction transistor device and method of making such a device
GLOBALFOUNDRIES US INC0 citations51
BOSCH GMBH ROBERT
3 patentsSHENZHEN HOLATEK CO LTD
3 patentsShowing the top 50 of 56 patents by PatentIndex Score.