P

Inventor

HU ZHENYU

US56 patents
⚠️ This page may combine multiple inventors who share the name “HU ZHENYU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

28 patents
US9653583B1May 16, 2017

Methods of forming diffusion breaks on integrated circuit products comprised of finFET devices

GLOBALFOUNDRIES INC79 citations98
US9064932B1Jun 23, 2015

Methods of forming gate structures by a gate-cut-last process and the resulting structures

GLOBALFOUNDRIES INC109 citations97
US8846491B1Sep 30, 2014

Forming a diffusion break during a RMG process

GLOBALFOUNDRIES INC97 citations97
US10083874B1Sep 25, 2018

Gate cut method

GLOBALFOUNDRIES INC38 citations94
US9455198B1Sep 27, 2016

Methods of removing fins so as to form isolation structures on products that include FinFET semiconductor devices

GLOBALFOUNDRIES INC51 citations94
US9406676B2Aug 2, 2016

Method for forming single diffusion breaks between finFET devices and the resulting devices

GLOBALFOUNDRIES INC41 citations94
US9935104B1Apr 3, 2018

Fin-type field effect transistors with single-diffusion breaks and method

GLOBALFOUNDRIES INC16 citations93
US9553194B1Jan 24, 2017

Method for improved fin profile

GLOBALFOUNDRIES INC19 citations92
US10326002B1Jun 18, 2019

Self-aligned gate contact and cross-coupling contact formation

GLOBALFOUNDRIES INC11 citations84
US10090382B1Oct 2, 2018

Integrated circuit structure including single diffusion break and end isolation region, and methods of forming same

GLOBALFOUNDRIES INC14 citations84
US9947769B1Apr 17, 2018

Multiple-layer spacers for field-effect transistors

GLOBALFOUNDRIES INC14 citations84
US9373535B2Jun 21, 2016

T-shaped fin isolation region and methods of fabrication

GLOBALFOUNDRIES INC7 citations84
US10396206B2Aug 27, 2019

Gate cut method

GLOBALFOUNDRIES INC7 citations83
US10559656B2Feb 11, 2020

Wrap-all-around contact for nanosheet-FET and method of forming same

GLOBALFOUNDRIES INC8 citations82
US10192746B1Jan 29, 2019

STI inner spacer to mitigate SDB loading

GLOBALFOUNDRIES INC12 citations80
US10475890B2Nov 12, 2019

Scaled memory structures or other logic devices with middle of the line cuts

GLOBALFOUNDRIES INC2 citations73
US10121788B1Nov 6, 2018

Fin-type field effect transistors with single-diffusion breaks and method

GLOBALFOUNDRIES INC2 citations73
US10083873B1Sep 25, 2018

Semiconductor structure with uniform gate heights

GLOBALFOUNDRIES INC5 citations73
US10056486B2Aug 21, 2018

Methods for fin thinning providing improved SCE and S/D EPI growth

GLOBALFOUNDRIES INC2 citations73
US10043713B1Aug 7, 2018

Method to reduce FinFET short channel gate height

GLOBALFOUNDRIES INC4 citations73
US8987083B1Mar 24, 2015

Uniform gate height for semiconductor structure with N and P type fins

GLOBALFOUNDRIES INC4 citations73
US10825897B2Nov 3, 2020

Formation of enhanced faceted raised source/drain EPI material for transistor devices

GLOBALFOUNDRIES INC2 citations72
US10777642B2Sep 15, 2020

Formation of enhanced faceted raised source/drain epi material for transistor devices

GLOBALFOUNDRIES INC2 citations72
US9219002B2Dec 22, 2015

Overlay performance for a fin field effect transistor device

GLOBALFOUNDRIES INC6 citations72
US9293586B2Mar 22, 2016

Epitaxial block layer for a fin field effect transistor device

GLOBALFOUNDRIES INC4 citations71
US9362176B2Jun 7, 2016

Uniform exposed raised structures for non-planar semiconductor devices

GLOBALFOUNDRIES INC2 citations63
US10643900B2May 5, 2020

Method to reduce FinFET short channel gate height

GLOBALFOUNDRIES INC0 citations52
US10431665B2Oct 1, 2019

Multiple-layer spacers for field-effect transistors

GLOBALFOUNDRIES INC0 citations52

GLOBALFOUNDRIES US INC

16 patents
US11888031B2Jan 30, 2024

Fin-based lateral bipolar junction transistor and method

GLOBALFOUNDRIES US INC2 citations73
US11705508B2Jul 18, 2023

Single fin structures

GLOBALFOUNDRIES US INC2 citations73
US11127842B2Sep 21, 2021

Single fin structures

GLOBALFOUNDRIES US INC4 citations73
US10957578B2Mar 23, 2021

Single diffusion break device for FDSOI

GLOBALFOUNDRIES US INC2 citations73
US12495575B2Dec 9, 2025

Multi-channel replacement metal gate device

GLOBALFOUNDRIES US INC0 citations63
US12261215B2Mar 25, 2025

Fin on silicon-on-insulator

GLOBALFOUNDRIES US INC0 citations63
US12107154B2Oct 1, 2024

Single fin structures

GLOBALFOUNDRIES US INC0 citations63
US11784224B2Oct 10, 2023

Lateral bipolar transistor structure with base over semiconductor buffer and related method

GLOBALFOUNDRIES US INC0 citations63
US12159926B2Dec 3, 2024

Lateral bipolar transistor

GLOBALFOUNDRIES US INC0 citations62
US11908898B2Feb 20, 2024

Lateral bipolar transistor structure with base layer of varying horizontal width and methods to form same

GLOBALFOUNDRIES US INC0 citations62
US11810969B2Nov 7, 2023

Lateral bipolar transistor

GLOBALFOUNDRIES US INC0 citations62
US12389627B2Aug 12, 2025

Silicon germanium fins and integration methods

GLOBALFOUNDRIES US INC0 citations52
US12364000B1Jul 15, 2025

Device structures for a high-voltage semiconductor device

GLOBALFOUNDRIES US INC0 citations52
US12272740B2Apr 8, 2025

Bipolar junction transistors with a nanosheet intrinsic base

GLOBALFOUNDRIES US INC0 citations52
US12205949B1Jan 21, 2025

High-voltage semiconductor device structures

GLOBALFOUNDRIES US INC0 citations52
US11264470B2Mar 1, 2022

Lateral bipolar junction transistor device and method of making such a device

GLOBALFOUNDRIES US INC0 citations51

BOSCH GMBH ROBERT

3 patents

SHENZHEN HOLATEK CO LTD

3 patents

Showing the top 50 of 56 patents by PatentIndex Score.