P

Inventor

PARK MIN SANG

KR58 patents
⚠️ This page may combine multiple inventors who share the name “PARK MIN SANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

28 patents
US6992506B2Jan 31, 2006

Integrated circuit devices having data inversion circuits therein with multi-bit prefetch structures and methods of operating same

SAMSUNG ELECTRONICS CO LTD17 citations92
US6704237B2Mar 9, 2004

Circuits for controlling internal power supply voltages provided to memory arrays based on requested operations and methods of operating

SAMSUNG ELECTRONICS CO LTD30 citations92
US6323693B1Nov 27, 2001

Current sense amplifier circuit using dummy bit line

SAMSUNG ELECTRONICS CO LTD26 citations92
US10090281B2Oct 2, 2018

Method and device for controlling operation using temperature deviation in multi-chip package

SAMSUNG ELECTRONICS CO LTD4 citations84
US7142021B2Nov 28, 2006

Data inversion circuits having a bypass mode of operation and methods of operating the same

SAMSUNG ELECTRONICS CO LTD16 citations84
US7187615B2Mar 6, 2007

Methods of selectively activating word line segments enabled by row addresses and semiconductor memory devices having partial activation commands of word line

SAMSUNG ELECTRONICS CO LTD11 citations82
US7408482B2Aug 5, 2008

Integrated circuit devices having data inversion circuits therein with multi-bit prefetch structures and methods of operating same

SAMSUNG ELECTRONICS CO LTD6 citations74
US7110276B2Sep 19, 2006

Integrated circuit memory devices reducing propagation delay differences between signals transmitted to separate spaced-apart memory blocks therein

SAMSUNG ELECTRONICS CO LTD9 citations74
US6825511B2Nov 30, 2004

Semiconductor device having fuse circuit on cell region and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD10 citations74
US11289457B2Mar 29, 2022

Method and device for controlling operation using temperature deviation in multi-chip package

SAMSUNG ELECTRONICS CO LTD2 citations73
US10804248B2Oct 13, 2020

Method and device for controlling operation using temperature deviation in multi-chip package

SAMSUNG ELECTRONICS CO LTD2 citations73
US10593650B2Mar 17, 2020

Method and device for controlling operation using temperature deviation in multi-chip package

SAMSUNG ELECTRONICS CO LTD2 citations73
US10446217B2Oct 15, 2019

Memory device and control method thereof

SAMSUNG ELECTRONICS CO LTD2 citations73
US10226886B2Mar 12, 2019

Slim injection molding apparatus

SAMSUNG ELECTRONICS CO LTD3 citations73
US10185341B2Jan 22, 2019

Semiconductor devices having voltage generators using weighted combination of feedback voltages

SAMSUNG ELECTRONICS CO LTD2 citations73
US10176852B2Jan 8, 2019

Semiconductor memory devices, methods of operation, and memory systems having reduced decoder width and core skew

SAMSUNG ELECTRONICS CO LTD6 citations73
US7525863B2Apr 28, 2009

Logic circuit setting optimization condition of semiconductor integrated circuit regardless of fuse cut

SAMSUNG ELECTRONICS CO LTD6 citations63
US7466608B2Dec 16, 2008

Data input/output circuit having data inversion determination function and semiconductor memory device having the same

SAMSUNG ELECTRONICS CO LTD3 citations63
US7368330B2May 6, 2008

Semiconductor device having fuse circuit on cell region and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD3 citations63
US7366822B2Apr 29, 2008

Semiconductor memory device capable of reading and writing data at the same time

SAMSUNG ELECTRONICS CO LTD6 citations63
US12199495B2Jan 14, 2025

Apparatus and method for measuring load current with high resolution

SAMSUNG ELECTRONICS CO LTD0 citations62
US11901801B2Feb 13, 2024

Apparatus and method for measuring load current with high resolution

SAMSUNG ELECTRONICS CO LTD0 citations62
US11640955B2May 2, 2023

Method and device for controlling operation using temperature deviation in multi-chip

SAMSUNG ELECTRONICS CO LTD0 citations62
US9171605B1Oct 27, 2015

Concentrated address detecting method of semiconductor device and concentrated address detecting circuit using the same

SAMSUNG ELECTRONICS CO LTD1 citations62
US12149155B2Nov 19, 2024

Apparatus and method for measuring low load current

SAMSUNG ELECTRONICS CO LTD0 citations56
US11863056B2Jan 2, 2024

Apparatus and method for measuring low load current

SAMSUNG ELECTRONICS CO LTD0 citations56
US10571944B2Feb 25, 2020

Semiconductor devices having voltage generators using weighted combination of feedback voltages

SAMSUNG ELECTRONICS CO LTD0 citations52
US7853840B2Dec 14, 2010

Semiconductor memory device and methods thereof

SAMSUNG ELECTRONICS CO LTD1 citations51

SK INNOVATION CO LTD

10 patents

SK HYNIX INC

7 patents

SAMSUNG MOBILE DISPLAY CO LTD

2 patents

PARK MIN-SANG

1 patent

BESPIN GLOBAL INC

1 patent

UNIV INDUSTRY COOPERATION GROUP KYUNG HEE UNIV

1 patent

Showing the top 50 of 58 patents by PatentIndex Score.