Inventor
VEZYRTZIS CHRISTOS
US23 patents
⚠️ This page may combine multiple inventors who share the name “VEZYRTZIS CHRISTOS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS10171081B1Jan 1, 2019
On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core
IBM11 citations84
US10552250B2Feb 4, 2020
Proactive voltage droop reduction and/or mitigation in a processor core
IBM6 citations83
US10261561B2Apr 16, 2019
Mitigation of on-chip supply voltage based on local and non-local (neighboring) cores' supply voltage information and decision
IBM13 citations81
US9702924B2Jul 11, 2017
Simultaneously measuring degradation in multiple FETs
IBM2 citations73
US11275644B2Mar 15, 2022
Proactive voltage droop reduction and/or mitigation in a processor core
IBM4 citations72
US9618966B2Apr 11, 2017
Pulse-drive resonant clock with on-the-fly mode change
IBM3 citations72
US9612614B2Apr 4, 2017
Pulse-drive resonant clock with on-the-fly mode change
IBM3 citations72
US10437311B2Oct 8, 2019
Mitigation of on-chip supply voltage noise by monitoring slope of supply voltage based on time-based sensors
IBM3 citations70
US11693728B2Jul 4, 2023
Proactive voltage droop reduction and/or mitigation in a processor core
IBM0 citations62
US11561595B2Jan 24, 2023
On-chip supply noise voltage reduction or mitigation using local detection loops
IBM0 citations62
US11073884B2Jul 27, 2021
On-chip supply noise voltage reduction or mitigation using local detection loops
IBM0 citations62
US11036276B2Jun 15, 2021
Mitigation of on-chip supply voltage noise by monitoring slope of supply voltage based on time-based sensors
IBM0 citations61
US10230360B2Mar 12, 2019
Increasing resolution of on-chip timing uncertainty measurements
IBM1 citations61
US10333520B2Jun 25, 2019
On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core
IBM0 citations52
US9829535B2Nov 28, 2017
Test structure to measure delay variability mismatch of digital logic paths
IBM0 citations52
US10666415B2May 26, 2020
Determining clock signal quality using a plurality of sensors
IBM0 citations51
US10652006B2May 12, 2020
Determining clock signal quality using a plurality of sensors
IBM0 citations51
US10145892B2Dec 4, 2018
Increasing the resolution of on-chip measurement circuits
IBM1 citations48
BITMAIN DEV INC
4 patentsUS11671079B1Jun 6, 2023
Systems and methods for concurrently driving clock pulse and clock pulse complement signals in latches of an application-specific integrated circuit
BITMAIN DEV INC0 citations57
US12057842B2Aug 6, 2024
Dynamic pulse generator with small propagation delay
BITMAIN DEV INC0 citations47
US12025658B2Jul 2, 2024
Circuit structure to measure outliers of process variation effects
BITMAIN DEV INC0 citations47
US11309874B1Apr 19, 2022
Sequential elements with programmable feedback to program leakage in ASICs
BITMAIN DEV INC0 citations47