P

Inventor

VEZYRTZIS CHRISTOS

US23 patents
⚠️ This page may combine multiple inventors who share the name “VEZYRTZIS CHRISTOS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

18 patents
US10171081B1Jan 1, 2019

On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core

IBM11 citations84
US10552250B2Feb 4, 2020

Proactive voltage droop reduction and/or mitigation in a processor core

IBM6 citations83
US10261561B2Apr 16, 2019

Mitigation of on-chip supply voltage based on local and non-local (neighboring) cores' supply voltage information and decision

IBM13 citations81
US9702924B2Jul 11, 2017

Simultaneously measuring degradation in multiple FETs

IBM2 citations73
US11275644B2Mar 15, 2022

Proactive voltage droop reduction and/or mitigation in a processor core

IBM4 citations72
US9618966B2Apr 11, 2017

Pulse-drive resonant clock with on-the-fly mode change

IBM3 citations72
US9612614B2Apr 4, 2017

Pulse-drive resonant clock with on-the-fly mode change

IBM3 citations72
US10437311B2Oct 8, 2019

Mitigation of on-chip supply voltage noise by monitoring slope of supply voltage based on time-based sensors

IBM3 citations70
US11693728B2Jul 4, 2023

Proactive voltage droop reduction and/or mitigation in a processor core

IBM0 citations62
US11561595B2Jan 24, 2023

On-chip supply noise voltage reduction or mitigation using local detection loops

IBM0 citations62
US11073884B2Jul 27, 2021

On-chip supply noise voltage reduction or mitigation using local detection loops

IBM0 citations62
US11036276B2Jun 15, 2021

Mitigation of on-chip supply voltage noise by monitoring slope of supply voltage based on time-based sensors

IBM0 citations61
US10230360B2Mar 12, 2019

Increasing resolution of on-chip timing uncertainty measurements

IBM1 citations61
US10333520B2Jun 25, 2019

On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core

IBM0 citations52
US9829535B2Nov 28, 2017

Test structure to measure delay variability mismatch of digital logic paths

IBM0 citations52
US10666415B2May 26, 2020

Determining clock signal quality using a plurality of sensors

IBM0 citations51
US10652006B2May 12, 2020

Determining clock signal quality using a plurality of sensors

IBM0 citations51
US10145892B2Dec 4, 2018

Increasing the resolution of on-chip measurement circuits

IBM1 citations48

BITMAIN DEV INC

4 patents

VEZYRTZIS CHRISTOS

1 patent