Inventor
PARK SUN-YONG
KR16 patents
⚠️ This page may combine multiple inventors who share the name “PARK SUN-YONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
3M INNOVATIVE PROPERTIES COMPANY
6 patentsUS12429641B2Sep 30, 2025
Organic light emitting diode display with color-correction component having different color mixing weights
3M INNOVATIVE PROPERTIES COMPANY0 citations61
US12007593B2Jun 11, 2024
Organic light emitting diode with color-correction for maximum white-point color shift
3M INNOVATIVE PROPERTIES COMPANY0 citations61
US11906840B2Feb 20, 2024
Optical film stack including retardation layer
3M INNOVATIVE PROPERTIES COMPANY0 citations60
US11506926B2Nov 22, 2022
Optical film stack including retardation layer
3M INNOVATIVE PROPERTIES COMPANY0 citations60
US12411275B2Sep 9, 2025
Optical stack having absorbing polarizer, half-wave retarder, and reflective polarizer
3M INNOVATIVE PROPERTIES COMPANY0 citations51
US11726245B2Aug 15, 2023
Partial reflector having stack of polymer layers for correcting color shift
3M INNOVATIVE PROPERTIES COMPANY0 citations48
SEMES CO LTD
4 patentsUS10699918B2Jun 30, 2020
Chemical supply unit and apparatus for treating a substrate
SEMES CO LTD1 citations58
US11933808B2Mar 19, 2024
Buffer unit and method for storaging substrate type sensor for measuring of horizontality of a substrate support member provided on a temperature varying atmosphere
SEMES CO LTD0 citations57
US12224189B2Feb 11, 2025
Substrate type sensor and method of measuring the impact point and the impact force of chemical
SEMES CO LTD0 citations54
US10232415B2Mar 19, 2019
Apparatus for treating substrate
SEMES CO LTD0 citations31
SAMSUNG ELECTRONICS CO LTD
3 patentsUS7427740B2Sep 23, 2008
Image sensor with drain region between optical black regions
SAMSUNG ELECTRONICS CO LTD12 citations83
US10567688B2Feb 18, 2020
Image sensor with test light shielding pattern, imaging device, and method of manufacturing image sensor chip package
SAMSUNG ELECTRONICS CO LTD3 citations65
US8023472B2Sep 20, 2011
Method for identifying home cell and apparatus thereof
SAMSUNG ELECTRONICS CO LTD2 citations61