Inventor
NAKAGAWA TAKEO
JP35 patents
⚠️ This page may combine multiple inventors who share the name “NAKAGAWA TAKEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIKAGAKU KENKYUSHO
7 patentsUS6180050B1Jan 30, 2001
Optical formation device and method
RIKAGAKU KENKYUSHO79 citations94
US5780070AJul 14, 1998
Apparatus for solidifying and shaping optically cured fluid by carrying out scanning simultaneously with recoating
RIKAGAKU KENKYUSHO56 citations93
US6224469B1May 1, 2001
Combined cutting and grinding tool
RIKAGAKU KENKYUSHO46 citations92
US5919012AJul 6, 1999
Method of high speed cutting mold and ultra-high speed milling machine
RIKAGAKU KENKYUSHO40 citations91
US6126523AOct 3, 2000
Optical dressing method, machining device based on this method, grindstone and polishing cloth
RIKAGAKU KENKYUSHO19 citations90
US5910040AJun 8, 1999
Method of controlling shape and NC processing apparatus utilizing the method
RIKAGAKU KENKYUSHO22 citations90
US5639363AJun 17, 1997
Apparatus and method for mirror surface grinding and grinding wheel therefore
RIKAGAKU KENKYUSHO21 citations90
HONGFUJIN PREC IND SHENZHEN
6 patentsUS7490413B2Feb 17, 2009
Contour measuring device with error correcting unit
HONGFUJIN PREC IND SHENZHEN8 citations84
US8052033B2Nov 8, 2011
Friction stir welding method
HONGFUJIN PREC IND SHENZHEN10 citations83
US7971770B2Jul 5, 2011
Friction stir method
HONGFUJIN PREC IND SHENZHEN10 citations83
US7726036B2Jun 1, 2010
Contour measuring probe
HONGFUJIN PREC IND SHENZHEN0 citations41
US7725290B2May 25, 2010
Contour measuring method for measuring aspects of objects
HONGFUJIN PREC IND SHENZHEN0 citations41
US7654008B2Feb 2, 2010
Contour measuring method for measuring aspects of objects
HONGFUJIN PREC IND SHENZHEN0 citations41