Inventor
Liao han-wen
TW20 patents
⚠️ This page may combine multiple inventors who share the name “Liao han-wen”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
17 patentsUS10504737B2Dec 10, 2019
Methods of enhancing surface topography on a substrate for inspection
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US10446662B2Oct 15, 2019
Reducing metal gate overhang by forming a top-wide bottom-narrow dummy gate electrode
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations81
US10784114B2Sep 22, 2020
Methods of enhancing surface topography on a substrate for inspection
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US11222788B2Jan 11, 2022
Methods of enhancing surface topography on a substrate for inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11011426B2May 18, 2021
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12142664B2Nov 12, 2024
Reducing metal gate overhang by forming a top-wide bottom-narrow dummy gate electrode
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12489001B2Dec 2, 2025
Wet etch apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US12249520B2Mar 11, 2025
Wet etch apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US11107707B2Aug 31, 2021
Wet etch apparatus and method of using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US10879052B2Dec 29, 2020
Plasma processing apparatus and manufacturing method using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10872760B2Dec 22, 2020
Cluster tool and manufacuturing method of semiconductor structure using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10026638B2Jul 17, 2018
Plasma distribution control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US11367591B2Jun 21, 2022
Composite plasma modulator for plasma chamber
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9087793B2Jul 21, 2015
Method for etching target layer of semiconductor device in etching apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US11626315B2Apr 11, 2023
Semiconductor structure and planarization method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US10872788B2Dec 22, 2020
Wet etch apparatus and method for using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US9412606B2Aug 9, 2016
Target dimension uniformity for semiconductor wafers
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
TAIWAN SEMICONDUCTOR MFG
3 patentsUS9064741B1Jun 23, 2015
Uniformity in wafer patterning using feedback control
TAIWAN SEMICONDUCTOR MFG3 citations61
US9324578B2Apr 26, 2016
Hard mask reshaping
TAIWAN SEMICONDUCTOR MFG0 citations51
US9362185B2Jun 7, 2016
Uniformity in wafer patterning using feedback control
TAIWAN SEMICONDUCTOR MFG0 citations50