Inventor
LIN CHUN-HSIUNG
TW116 patents
⚠️ This page may combine multiple inventors who share the name “LIN CHUN-HSIUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
40 patentsUS10109721B2Oct 23, 2018
Horizontal gate-all-around device having wrapped-around source and drain
TAIWAN SEMICONDUCTOR MFG CO LTD140 citations99
US9536738B2Jan 3, 2017
Vertical gate all around (VGAA) devices and methods of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD878 citations99
US9543419B1Jan 10, 2017
FinFET structures and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD25 citations94
US9941374B2Apr 10, 2018
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations93
US9754840B2Sep 5, 2017
Horizontal gate-all-around device having wrapped-around source and drain
TAIWAN SEMICONDUCTOR MFG CO LTD18 citations93
US9508858B2Nov 29, 2016
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations93
US10923598B2Feb 16, 2021
Gate-all-around structure and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations86
US11276763B2Mar 15, 2022
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US11158727B2Oct 26, 2021
Structure and method for gate-all-around device with extended channel
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations84
US10944009B2Mar 9, 2021
Methods of fabricating a FinFET device with wrap-around silicide source/drain structure
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10804162B2Oct 13, 2020
Dual channel gate all around transistor device and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10510860B2Dec 17, 2019
Semiconductor device and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10497792B2Dec 3, 2019
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10157995B2Dec 18, 2018
Integrating junction formation of transistors with contact formation
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9716096B1Jul 25, 2017
Semiconductor structure with feature spacer and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD16 citations84
US9564363B1Feb 7, 2017
Method of forming butted contact
TAIWAN SEMICONDUCTOR MFG CO LTD12 citations84
US9536962B1Jan 3, 2017
Source/drain regions for high electron mobility transistors (HEMT) and methods of forming same
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US12119404B2Oct 15, 2024
Gate all around structure with additional silicon layer and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11996483B2May 28, 2024
FET with wrap-around silicide and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11961892B2Apr 16, 2024
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11929417B2Mar 12, 2024
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11777033B2Oct 3, 2023
Transistors having vertical nanostructures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11777009B2Oct 3, 2023
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11695076B2Jul 4, 2023
FET with wrap-around silicide and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11637207B2Apr 25, 2023
Gate-all-around structure and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11532521B2Dec 20, 2022
Dual channel gate all around transistor device and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11430891B2Aug 30, 2022
Gate all around structure with additional silicon layer and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11348836B2May 31, 2022
Semiconductor structure with nanostructure and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11264485B2Mar 1, 2022
Spacer structure for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10861953B2Dec 8, 2020
Air spacers in transistors and methods forming same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10847373B2Nov 24, 2020
Methods of forming silicide contact in field-effect transistors
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10847426B2Nov 24, 2020
FinFET devices and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10811515B2Oct 20, 2020
Methods of fabricating semiconductor devices having air-gap spacers
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10734500B2Aug 4, 2020
Horizontal gate all-around device having wrapped-around source and drain
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10727134B2Jul 28, 2020
Methods of fabricating semiconductor devices with gate-all-around structure
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10438948B2Oct 8, 2019
Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10002796B1Jun 19, 2018
Dual epitaxial growth process for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9786757B2Oct 10, 2017
Method of forming horizontal gate all around structure
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11374108B2Jun 28, 2022
Fin semiconductor device having a stepped gate spacer sidewall
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US12336261B2Jun 17, 2025
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
MACASE IND GROUP GA INC
3 patentsLATSHAW ENTERPRISES INC
2 patentsTAIWAN SEMICONDUCTOR MFG
2 patentsASIA OPTICAL CO LTD
1 patentPARABELLUM STRATEGIC OPPORTUNITIES FUND LLC
1 patentASIA OPTICAL CO INC
1 patentShowing the top 50 of 116 patents by PatentIndex Score.