Inventor
TOBITA YOUICHI
JP111 patents
⚠️ This page may combine multiple inventors who share the name “TOBITA YOUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
48 patentsUS8816949B2Aug 26, 2014
Shift register circuit and image display comprising the same
MITSUBISHI ELECTRIC CORP46 citations98
US7825888B2Nov 2, 2010
Shift register circuit and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP74 citations98
US7738623B2Jun 15, 2010
Shift register circuit and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP75 citations98
US7664218B2Feb 16, 2010
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP61 citations98
US7636412B2Dec 22, 2009
Shift register circuit and image display apparatus equipped with the same
MITSUBISHI ELECTRIC CORP59 citations98
US7492853B2Feb 17, 2009
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP73 citations98
US7436923B2Oct 14, 2008
Shift register circuit and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP149 citations98
US7289593B2Oct 30, 2007
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP45 citations96
US6388886B1May 14, 2002
Semiconductor memory module and module system
MITSUBISHI ELECTRIC CORP62 citations96
US6388934B1May 14, 2002
Semiconductor memory device operating at high speed with low current consumption
MITSUBISHI ELECTRIC CORP65 citations96
US6087885AJul 11, 2000
Semiconductor device allowing fast and stable transmission of signals
MITSUBISHI ELECTRIC CORP78 citations96
US5900665AMay 4, 1999
Semiconductor integrated circuit device operating at high speed with low current consumption
MITSUBISHI ELECTRIC CORP73 citations96
US5815446ASep 29, 1998
Potential generation circuit
MITSUBISHI ELECTRIC CORP49 citations96
US5805508ASep 8, 1998
Semiconductor memory device with reduced leak current
MITSUBISHI ELECTRIC CORP65 citations96
US5801412ASep 1, 1998
Semiconductor device having a capacitance element with excellent area efficiency
MITSUBISHI ELECTRIC CORP57 citations96
US5276649AJan 4, 1994
Dynamic-type semiconductor memory device having staggered activation of column groups
MITSUBISHI ELECTRIC CORP141 citations96
US5267200ANov 30, 1993
Semiconductor memory device and operating method thereof with transfer transistor used as a holding means
MITSUBISHI ELECTRIC CORP69 citations96
US5079744AJan 7, 1992
Test apparatus for static-type semiconductor memory devices
MITSUBISHI ELECTRIC CORP75 citations96
US4980799ADec 25, 1990
Electrostatic capacity device in semiconductor memory device, and apparatus for and method of driving sense amplifier using electrostatic capacity device
MITSUBISHI ELECTRIC CORP59 citations96
US4961007AOct 2, 1990
Substrate bias potential generator of a semiconductor integrated circuit device and a generating method therefor
MITSUBISHI ELECTRIC CORP101 citations96
US4860259AAug 22, 1989
Dram with reduced-test-time mode
MITSUBISHI ELECTRIC CORP65 citations96
US8023610B2Sep 20, 2011
Semiconductor device and shift register circuit
MITSUBISHI ELECTRIC CORP43 citations94
US8379790B2Feb 19, 2013
Shift register circuit
MITSUBISHI ELECTRIC CORP14 citations93
US7627076B2Dec 1, 2009
Shift register circuit and image display apparatus having the same
MITSUBISHI ELECTRIC CORP26 citations93
US7499518B2Mar 3, 2009
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP23 citations93
US7443944B2Oct 28, 2008
Shift register, image display apparatus containing the same and signal generation circuit
MITSUBISHI ELECTRIC CORP42 citations93
US7403586B2Jul 22, 2008
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP23 citations93
US7372300B2May 13, 2008
Shift register and image display apparatus containing the same
MITSUBISHI ELECTRIC CORP26 citations93
US7324079B2Jan 29, 2008
Image display apparatus
MITSUBISHI ELECTRIC CORP21 citations93
US7212183B2May 1, 2007
Liquid crystal display apparatus having pixels with low leakage current
MITSUBISHI ELECTRIC CORP32 citations93
US7138831B2Nov 21, 2006
Level conversion circuit and serial/parallel conversion circuit with level conversion function
MITSUBISHI ELECTRIC CORP26 citations93
US6980194B2Dec 27, 2005
Amplitude conversion circuit for converting signal amplitude
MITSUBISHI ELECTRIC CORP39 citations93
US6919743B2Jul 19, 2005
Drive circuit with low current consumption
MITSUBISHI ELECTRIC CORP32 citations93
US6630627B1Oct 7, 2003
Multilayered wiring substrate with dummy wirings in parallel to signal wirings and with
MITSUBISHI ELECTRIC CORP21 citations93
US6111449AAug 29, 2000
Clamping circuit for absorbing ringing of signal
MITSUBISHI ELECTRIC CORP25 citations93
US6087813AJul 11, 2000
Internal voltage generation circuit capable of stably generating internal voltage with low power consumption
MITSUBISHI ELECTRIC CORP28 citations93
US6052324AApr 18, 2000
Semiconductor memory device capable of fast sensing operation
MITSUBISHI ELECTRIC CORP38 citations93
US6043638AMar 28, 2000
Reference voltage generating circuit capable of generating stable reference voltage independent of operating environment
MITSUBISHI ELECTRIC CORP29 citations93
US6034391AMar 7, 2000
Semiconductor device including capacitance element having high area efficiency
MITSUBISHI ELECTRIC CORP34 citations93
US5757225AMay 26, 1998
Voltage generation circuit that can stably generate intermediate potential independent of threshold voltage
MITSUBISHI ELECTRIC CORP33 citations93
US5717324AFeb 10, 1998
Intermediate potential generation circuit
MITSUBISHI ELECTRIC CORP20 citations93
US5548596AAug 20, 1996
Semiconductor memory device with read out data transmission bus for simultaneously testing a plurality of memory cells and testing method thereof
MITSUBISHI ELECTRIC CORP37 citations93
US5404335AApr 4, 1995
Dynamic type semiconductor memory device operable in a self-refreshing mode
MITSUBISHI ELECTRIC CORP29 citations93
US5132932AJul 21, 1992
Dynamic random access memory having a plurality of rated voltages as operation supply voltage and operating method thereof
MITSUBISHI ELECTRIC CORP36 citations93
US5065091ANov 12, 1991
Semiconductor integrated circuit device testing
MITSUBISHI ELECTRIC CORP35 citations93
US5023840AJun 11, 1991
Semiconductor memory device having testing function and testing method thereof
MITSUBISHI ELECTRIC CORP31 citations93
US4951256AAug 21, 1990
Apparatus and method for driving sense amplifier in dynamic random access memory
MITSUBISHI ELECTRIC CORP23 citations93
US4792928ADec 20, 1988
Semiconductor memory circuit with control of bit line voltage balancing
MITSUBISHI ELECTRIC CORP27 citations93
TOBITA YOUICHI
2 patentsShowing the top 50 of 111 patents by PatentIndex Score.