Inventor
SONG YOON-JONG
KR40 patents
⚠️ This page may combine multiple inventors who share the name “SONG YOON-JONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
31 patentsUS6737694B2May 18, 2004
Ferroelectric memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD39 citations93
US6713310B2Mar 30, 2004
Ferroelectric memory device using via etch-stop layer and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD18 citations93
US7482616B2Jan 27, 2009
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD39 citations92
US6979881B2Dec 27, 2005
Ferroelectric integrated circuit devices having an oxygen penetration path
SAMSUNG ELECTRONICS CO LTD16 citations92
US7453111B2Nov 18, 2008
Phase-change memory device
SAMSUNG ELECTRONICS CO LTD35 citations90
US8026543B2Sep 27, 2011
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD12 citations84
US7906773B2Mar 15, 2011
Phase change memory device
SAMSUNG ELECTRONICS CO LTD13 citations84
US6909134B2Jun 21, 2005
Ferroelectric memory device using via etch-stop layer and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD13 citations84
US7939366B2May 10, 2011
Phase change memory devices and methods of forming the same
SAMSUNG ELECTRONICS CO LTD7 citations83
US7696508B2Apr 13, 2010
Phase change memory devices having dual lower electrodes
SAMSUNG ELECTRONICS CO LTD13 citations83
US10833250B2Nov 10, 2020
Magnetoresistive random access memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD5 citations82
US7977662B2Jul 12, 2011
Phase-changeable memory devices having reduced susceptibility to thermal interference
SAMSUNG ELECTRONICS CO LTD10 citations82
US7309885B2Dec 18, 2007
PRAMs having a plurality of active regions located vertically in sequence and methods of forming the same
SAMSUNG ELECTRONICS CO LTD15 citations82
US6956279B2Oct 18, 2005
Semiconductor device having multi-layer oxygen barrier pattern
SAMSUNG ELECTRONICS CO LTD6 citations74
US10651236B2May 12, 2020
Semiconductor device including variable resistance memory device
SAMSUNG ELECTRONICS CO LTD2 citations73
US10319784B2Jun 11, 2019
Semiconductor device including variable resistance memory device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9431610B2Aug 30, 2016
Methods of manufacturing a phase change memory device including a heat sink
SAMSUNG ELECTRONICS CO LTD4 citations73
US7348616B2Mar 25, 2008
Ferroelectric integrated circuit devices having an oxygen penetration path
SAMSUNG ELECTRONICS CO LTD7 citations73
US7045839B2May 16, 2006
Ferroelectric memory devices with improved ferroelectric properties and associated methods for fabricating such memory devices
SAMSUNG ELECTRONICS CO LTD7 citations72
US7064366B2Jun 20, 2006
Ferroelectric memory devices having an expanded plate electrode
SAMSUNG ELECTRONICS CO LTD9 citations67
US7498179B2Mar 3, 2009
Semiconductor device having ferroelectric material capacitor and method of making the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US6825082B2Nov 30, 2004
Ferroelectric memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD4 citations63
US6911362B2Jun 28, 2005
Methods for forming electronic devices including capacitor structures
SAMSUNG ELECTRONICS CO LTD6 citations62
US11462679B2Oct 4, 2022
Magnetoresistive random access memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations60
US7479405B2Jan 20, 2009
PRAMS having a plurality of active regions located vertically in sequence and methods of forming the same
SAMSUNG ELECTRONICS CO LTD2 citations60
US7932102B2Apr 26, 2011
Phase change memory and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7888667B2Feb 15, 2011
Phase change memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US11301319B2Apr 12, 2022
Memory device and memory system having multiple error correction functions, and operating method thereof
SAMSUNG ELECTRONICS CO LTD0 citations51
US7488628B2Feb 10, 2009
Methods for fabricating ferroelectric memory devices with improved ferroelectric properties
SAMSUNG ELECTRONICS CO LTD0 citations50
US10109676B2Oct 23, 2018
MTJ structures including magnetism induction pattern and magnetoresistive random access memory devices including the same
SAMSUNG ELECTRONICS CO LTD0 citations48
US8043924B2Oct 25, 2011
Methods of forming phase-change memory units, and methods of manufacturing phase-change memory devices using the same
SAMSUNG ELECTRONICS CO LTD0 citations41