Inventor
SHEN YANPING
US28 patents
⚠️ This page may combine multiple inventors who share the name “SHEN YANPING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES US INC
15 patentsUS11482456B2Oct 25, 2022
Forming two portion spacer after metal gate and contact formation, and related IC structure
GLOBALFOUNDRIES US INC4 citations73
US11812670B2Nov 7, 2023
Memory device comprising a top via electrode and methods of making such a memory device
GLOBALFOUNDRIES US INC0 citations62
US11785860B2Oct 10, 2023
Top electrode for a memory device and methods of making such a memory device
GLOBALFOUNDRIES US INC1 citations62
US11721728B2Aug 8, 2023
Self-aligned contact
GLOBALFOUNDRIES US INC0 citations62
US11342453B2May 24, 2022
Field effect transistor with asymmetric gate structure and method
GLOBALFOUNDRIES US INC1 citations62
US11264504B2Mar 1, 2022
Active and dummy fin structures
GLOBALFOUNDRIES US INC0 citations62
US11239336B2Feb 1, 2022
Integrated circuit structure with niobium-based silicide layer and methods to form same
GLOBALFOUNDRIES US INC0 citations62
US11171237B2Nov 9, 2021
Middle of line gate structures
GLOBALFOUNDRIES US INC1 citations62
US11094827B2Aug 17, 2021
Semiconductor devices with uniform gate height and method of forming same
GLOBALFOUNDRIES US INC1 citations62
US11569437B2Jan 31, 2023
Memory device comprising a top via electrode and methods of making such a memory device
GLOBALFOUNDRIES US INC0 citations61
US11222844B2Jan 11, 2022
Via structures for use in semiconductor devices
GLOBALFOUNDRIES US INC0 citations61
US11908857B2Feb 20, 2024
Semiconductor devices having late-formed isolation structures
GLOBALFOUNDRIES US INC0 citations52
US11502200B2Nov 15, 2022
Transistor device having sidewall spacers contacting lower surfaces of an epitaxial semiconductor material
GLOBALFOUNDRIES US INC0 citations52
US11437568B2Sep 6, 2022
Memory device and methods of making such a memory device
GLOBALFOUNDRIES US INC0 citations52
US11164794B2Nov 2, 2021
Semiconductor structures in a wide gate pitch region of semiconductor devices
GLOBALFOUNDRIES US INC0 citations51
GLOBALFOUNDRIES INC
12 patentsUS10249538B1Apr 2, 2019
Method of forming vertical field effect transistors with different gate lengths and a resulting structure
GLOBALFOUNDRIES INC22 citations94
US9887094B1Feb 6, 2018
Methods of forming EPI semiconductor material on the source/drain regions of a FinFET device
GLOBALFOUNDRIES INC14 citations84
US9443771B1Sep 13, 2016
Methods to thin down RMG sidewall layers for scalability of gate-last planar CMOS and FinFET technology
GLOBALFOUNDRIES INC10 citations84
US10068902B1Sep 4, 2018
Integrated circuit structure incorporating non-planar field effect transistors with different channel region heights and method
GLOBALFOUNDRIES INC4 citations73
US10553707B1Feb 4, 2020
FinFETs having gates parallel to fins
GLOBALFOUNDRIES INC5 citations71
US10811422B2Oct 20, 2020
Semiconductor recess to epitaxial regions and related integrated circuit structure
GLOBALFOUNDRIES INC1 citations62
US10700173B2Jun 30, 2020
FinFET device with a wrap-around silicide source/drain contact structure
GLOBALFOUNDRIES INC0 citations51
US10636894B2Apr 28, 2020
Fin-type transistors with spacers on the gates
GLOBALFOUNDRIES INC0 citations51
US10833171B1Nov 10, 2020
Spacer structures on transistor devices
GLOBALFOUNDRIES INC0 citations42
US10818498B1Oct 27, 2020
Shaped gate caps in spacer-lined openings
GLOBALFOUNDRIES INC0 citations42
US10164010B1Dec 25, 2018
Finfet diffusion break having protective liner in fin insulator
GLOBALFOUNDRIES INC0 citations40
US10461155B2Oct 29, 2019
Epitaxial region for embedded source/drain region having uniform thickness
GLOBALFOUNDRIES INC0 citations35