P

Inventor

NAKAGAWA SHUICHI

JP71 patents
⚠️ This page may combine multiple inventors who share the name “NAKAGAWA SHUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

16 patents
US10591018B2Mar 17, 2020

Vibration-suppressing mechanism to be attached to charged particle beam device, and charged particle beam device

HITACHI HIGH TECH CORP2 citations73
US9502208B2Nov 22, 2016

Charged particle beam apparatus, stage controlling method, and stage system

HITACHI HIGH TECH CORP4 citations73
US9368320B2Jun 14, 2016

Stage apparatus, and charged particle beam apparatus using same

HITACHI HIGH TECH CORP3 citations73
US7541719B2Jun 2, 2009

Stage and X-Y stage each on which to place sample, and charged-particle beam apparatus

HITACHI HIGH TECH CORP4 citations63
US11664185B2May 30, 2023

Vibration damping system for charged particle beam apparatus

HITACHI HIGH TECH CORP0 citations62
US10770259B2Sep 8, 2020

Stage device and charged particle beam device

HITACHI HIGH TECH CORP1 citations62
US10586676B2Mar 10, 2020

Charged particle beam device

HITACHI HIGH TECH CORP1 citations62
US8946652B2Feb 3, 2015

Sample positioning apparatus, sample stage, and charged particle beam apparatus

HITACHI HIGH TECH CORP2 citations62
US7795581B2Sep 14, 2010

Pattern measuring method and electron microscope

HITACHI HIGH TECH CORP2 citations62
US6943945B2Sep 13, 2005

Two axis state for microscope

HITACHI HIGH TECH CORP3 citations62
US11049687B2Jun 29, 2021

Stage apparatus and charged particle beam apparatus

HITACHI HIGH TECH CORP1 citations61
US10840059B2Nov 17, 2020

Charged particle radiation device

HITACHI HIGH TECH CORP1 citations57
US11380515B2Jul 5, 2022

Charged particle beam device

HITACHI HIGH TECH CORP0 citations56
US11342156B2May 24, 2022

Charged particle beam apparatus, sample alignment method of charged particle beam apparatus

HITACHI HIGH TECH CORP0 citations52
US10804067B2Oct 13, 2020

Charged particle beam apparatus comprising a controller to set control parameters based on movement of the sample stage

HITACHI HIGH TECH CORP0 citations52
US10366912B2Jul 30, 2019

Stage apparatus and charged particle beam apparatus

HITACHI HIGH TECH CORP0 citations52

MINOLTA CO LTD

8 patents

ROLAND CORP

6 patents

MINOLTA CAMERA KK

4 patents

YOKOGAWA HOKUSHIN ELECTRIC

3 patents

FUJITSU LTD

2 patents

MITSUBISHI ELECTRIC CORP

2 patents

YOSHIKAWA IRON WORKS

1 patent

MUTO DAISUKE

1 patent

YANMAR CO LTD

1 patent

YOKOGAWA ELECTRIC WORKS LTD

1 patent

YANMAR POWER TECHNOLOGY CO LTD

1 patent

FUJITA MASASHI

1 patent

RICOH CO LTD

1 patent

KOYAMA MASAHIRO

1 patent

KITSUNAI HIROYUKI

1 patent

Showing the top 50 of 71 patents by PatentIndex Score.