Inventor
HALPERIN ARNOLD
US20 patents
Patents
20 patentsUS6226619B1May 1, 2001
Method and system for preventing counterfeiting of high price wholesale and retail items
IBM355 citations99
US5559428ASep 24, 1996
In-situ monitoring of the change in thickness of films
IBM258 citations99
US6115616ASep 5, 2000
Hand held telephone set with separable keyboard
IBM115 citations98
US6072313AJun 6, 2000
In-situ monitoring and control of conductive films by detecting changes in induced eddy currents
IBM163 citations98
US5731697AMar 24, 1998
In-situ monitoring of the change in thickness of films
IBM108 citations98
US5660672AAug 26, 1997
In-situ monitoring of conductive films on semiconductor wafers
IBM155 citations98
US5644221AJul 1, 1997
Endpoint detection for chemical mechanical polishing using frequency or amplitude mode
IBM135 citations98
US5659492AAug 19, 1997
Chemical mechanical polishing endpoint process control
IBM60 citations96
US4496900AJan 29, 1985
Nonlinearity detection using fault-generated second harmonic
IBM102 citations96
US6242923B1Jun 5, 2001
Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards
IBM37 citations92
US6141093AOct 31, 2000
Method and apparatus for locating power plane shorts using polarized light microscopy
IBM31 citations92
US4868506ASep 19, 1989
Defect detection using intermodulation signals
IBM37 citations91
US5770948AJun 23, 1998
Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool
IBM36 citations88
US5663637ASep 2, 1997
Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool
IBM41 citations87
US6400128B2Jun 4, 2002
Thermal modulation system and method for locating a circuit defect
IBM12 citations73
US6337218B1Jan 8, 2002
Method to test devices on high performance ULSI wafers
IBM7 citations73
US5621327AApr 15, 1997
System and method for testing and fault isolation of high density passive boards and substrates
IBM11 citations71
US5402072AMar 28, 1995
System and method for testing and fault isolation of high density passive boards and substrates
IBM14 citations71
US6236196B1May 22, 2001
Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry
IBM4 citations62
US7808257B2Oct 5, 2010
Ionization test for electrical verification
IBM0 citations46