Inventor
LIN YUNG-TAO
SG28 patents
⚠️ This page may combine multiple inventors who share the name “LIN YUNG-TAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHARTERED SEMICONDUCTOR MFG
16 patentsUS6518122B1Feb 11, 2003
Low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG43 citations96
US6147008ANov 14, 2000
Creation of multiple gate oxide with high thickness ratio in flash memory process
CHARTERED SEMICONDUCTOR MFG40 citations92
US6177304B1Jan 23, 2001
Self-aligned contact process using a poly-cap mask
CHARTERED SEMICONDUCTOR MFG25 citations91
US6649461B1Nov 18, 2003
Method of angle implant to improve transistor reverse narrow width effect
CHARTERED SEMICONDUCTOR MFG35 citations90
US6180430B1Jan 30, 2001
Methods to reduce light leakage in LCD-on-silicon devices
CHARTERED SEMICONDUCTOR MFG28 citations89
US6703659B2Mar 9, 2004
Low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG21 citations87
US6362045B1Mar 26, 2002
Method to form non-volatile memory cells
CHARTERED SEMICONDUCTOR MFG33 citations87
US6284603B1Sep 4, 2001
Flash memory cell structure with improved channel punch-through characteristics
CHARTERED SEMICONDUCTOR MFG34 citations86
US6509264B1Jan 21, 2003
Method to form self-aligned silicide with reduced sheet resistance
CHARTERED SEMICONDUCTOR MFG18 citations84
US6399443B1Jun 4, 2002
Method for manufacturing dual voltage flash integrated circuit
CHARTERED SEMICONDUCTOR MFG15 citations83
US6828194B2Dec 7, 2004
Low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG7 citations73
US6569699B1May 27, 2003
Two layer mirror for LCD-on-silicon products and method of fabrication thereof
CHARTERED SEMICONDUCTOR MFG12 citations73
US6376298B1Apr 23, 2002
Layout method for scalable design of the aggressive RAM cells using a poly-cap mask
CHARTERED SEMICONDUCTOR MFG11 citations73
US6573143B1Jun 3, 2003
Trench transistor structure and formation method
CHARTERED SEMICONDUCTOR MFG9 citations66
US6822268B2Nov 23, 2004
Two layer mirror for LCD-on-silicon products and method of fabrication thereof
CHARTERED SEMICONDUCTOR MFG4 citations62
US6760258B2Jul 6, 2004
Means to erase a low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG3 citations62
ADVANCED MICRO DEVICES INC
10 patentsUS5917332AJun 29, 1999
Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer
ADVANCED MICRO DEVICES INC110 citations98
US5930138AJul 27, 1999
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC85 citations96
US5896294AApr 20, 1999
Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring
ADVANCED MICRO DEVICES INC145 citations94
US5598341AJan 28, 1997
Real-time in-line defect disposition and yield forecasting system
ADVANCED MICRO DEVICES INC82 citations94
US6001663ADec 14, 1999
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC46 citations92
US5821765AOct 13, 1998
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC20 citations92
US5761065AJun 2, 1998
Arrangement and method for detecting sequential processing effects in manufacturing
ADVANCED MICRO DEVICES INC61 citations92
US5716856AFeb 10, 1998
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC17 citations92
US5670891ASep 23, 1997
Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC16 citations82
US5963780AOct 5, 1999
Method for detecting defect sizes in polysilicon and source-drain semiconductor devices
ADVANCED MICRO DEVICES INC5 citations74