Inventor

TAKAGI YUJI

JP198 patents

⚠️ This page may combine multiple inventors who share the name “TAKAGI YUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAKAGI YUJI

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Multi-layered optical disk with track and layer identification

Data recording and reproducing apparatus having a plurality of operating modes

Optical information recording and reproducing system using optical disks having an error correction function

Optical disk, optical disk recording and reproducing apparatus, method for recording, reproducing and deleting data on optical disk, and information processing system

Disc having a data read-only area and a data recording arm and a recording reproducing system therefor

Method for substituting defective recording of discoid recording medium and discoid recording medium recording and reproducing device

Simultaneous recording and reproduction apparatus and simultaneous multi-channel reproduction apparatus

Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium

Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium

Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium

Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium

Method of manufacturing a multilayered optical disc

Optical disk and an optical disk recording/reproduction device having address blocks located on boundary lines between adjoining tracks

Optical disk and an optical disk recording reproduction device

Optical disk and optical disk recording and reproducing apparatus

Method of producing file management structures, information reproduction apparatus and information reproducing method

Double-sided recordable optical disk suitable for a substituting process and a method for performing defect management

Method of recording/reproducing optical disk data

Information recording medium and information recording and reproducing apparatus

Optical disc recording-reproducing apparatus in which sector substitution of defective sectors is performed

Composite optical disc having both a data read-only area and a data rewritable area, and a recording/reproducing system for use therewith

Optical information recording and reproducing system and optical disk

Rewritable optical disk with defective-sector substitution arrangement and optical information recording and reproducing system

Optical disk duplicating apparatus using sector data identification information for controlling duplication

Interleaving circuit

HITACHI LTD

Defect inspection method and apparatus

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices

Bio electron microscope and observation method of specimen

Pattern inspection method and apparatus

Visual inspection method and apparatus therefor

Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices

Scanning electron microscope having magnification switching control

Method for analyzing defect data and inspection apparatus and review system

Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof

Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

Method and apparatus for inspecting surface pattern of object

Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus

Defect inspection method and apparatus

Method and system for monitoring a semiconductor device manufacturing process

Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data

Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data

HITACHI HIGH TECH CORP

Method and apparatus for analyzing defect data and a review system

Method and apparatus for detecting pattern defects

Method of classifying defects using multiple inspection machines

Method for analyzing defect data and inspection apparatus and review system

MASTUSHITA ELECTRIC IND CO LTD

Multi-layered optical disk with shifted track and layer identification and method of detecting a track

MATSUSHITA ELECTRIC CO

Multi-layered optical disk with shifted track and layer identification and method of detecting a track

MATSHUSHITA ELECTRICAL IND CO

Multi-layered optical disk with track and layer identification