Inventor
NARITA KAZUHITO
JP24 patents
⚠️ This page may combine multiple inventors who share the name “NARITA KAZUHITO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
21 patentsUS6342715B1Jan 29, 2002
Nonvolatile semiconductor memory device
TOSHIBA KK216 citations99
US6340611B1Jan 22, 2002
Nonvolatile semiconductor memory device
TOSHIBA KK160 citations99
US6222225B1Apr 24, 2001
Semiconductor device and manufacturing method thereof
TOSHIBA KK176 citations99
US6258665B1Jul 10, 2001
Non-volatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK46 citations96
US6240012B1May 29, 2001
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK22 citations96
US6933194B2Aug 23, 2005
Method of manufacturing semiconductor device using STI technique
TOSHIBA KK25 citations92
US6462373B2Oct 8, 2002
Nonvolatile semiconductor memory device having tapered portion on side wall of charge accumulation layer
TOSHIBA KK27 citations92
US6413809B2Jul 2, 2002
Method of manufacturing a non-volatile memory having an element isolation insulation film embedded in the trench
TOSHIBA KK27 citations92
US6060740AMay 9, 2000
Non-volatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK40 citations92
US7359228B2Apr 15, 2008
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK5 citations74
US7002845B2Feb 21, 2006
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK4 citations74
US6836444B2Dec 28, 2004
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK4 citations74
US6611447B2Aug 26, 2003
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK6 citations74
US6424588B2Jul 23, 2002
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK6 citations74
US5856241AJan 5, 1999
Method of manufacturing semiconductor device
TOSHIBA KK8 citations74
US6642568B2Nov 4, 2003
Semiconductor device and method of manufacturing the same
TOSHIBA KK6 citations73
US7787277B2Aug 31, 2010
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK2 citations63
US7297599B2Nov 20, 2007
Method of fabricating semiconductor device
TOSHIBA KK6 citations62
US7195968B2Mar 27, 2007
Method of fabricating semiconductor device
TOSHIBA KK5 citations62
US7151685B2Dec 19, 2006
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK0 citations52
US7238975B2Jul 3, 2007
Nonvolatile semiconductor memory device and manufacturing method therefor
TOSHIBA KK0 citations40
NAKAMURA HIROSHI
3 patentsUS8665661B2Mar 4, 2014
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52
US8259494B2Sep 4, 2012
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52
US8248849B2Aug 21, 2012
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52