Inventor
HIGASHI TATSUSHI
JP3 patents
Patents
3 patentsUS5932891AAug 3, 1999
Semiconductor device with test terminal and IC socket
MITSUBISHI ELECTRIC CORP52 citations92
US6151695ANov 21, 2000
Test method of chips in a semiconductor wafer employing a test algorithm
MITSUBISHI ELECTRIC CORP9 citations70
US6589063B2Jul 8, 2003
Electric contact device for establishing an improved contact with contactors of other device
MITSUBISHI ELECTRIC CORP2 citations58