Inventor · disambiguated record
Seuk Hwan Choi
Also filed as: CHOI SEUK HWAN
3 granted patents·6 citations·filing 2015–2020
59Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0185US9892500B2Method for grouping region of interest of mask pattern and measuring critical dimension of mask pattern using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 13, 2018·4 cites·15 claims
- 0276US10831095B2Critical dimension measurement system and method of measuring critical dimensions using sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 10, 2020·2 cites·20 claims
- 0361US11397380B2Critical dimension measurement system and method of measuring critical dimensions using sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 26, 2022·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →