Inventor
OKAI MAKOTO
JP35 patents
⚠️ This page may combine multiple inventors who share the name “OKAI MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
17 patentsUS5119393AJun 2, 1992
Semiconductor laser device capable of controlling wavelength shift
HITACHI LTD81 citations96
US4885753ADec 5, 1989
Semiconductor laser device of variable wavelength type
HITACHI LTD69 citations96
US5340637AAug 23, 1994
Optical device diffraction gratings and a photomask for use in the same
HITACHI LTD67 citations94
US4905060AFeb 27, 1990
Light emitting device with disordered region
HITACHI LTD45 citations93
US4894835AJan 16, 1990
Surface emitting type semiconductor laser
HITACHI LTD40 citations93
US4873691AOct 10, 1989
Wavelength-tunable semiconductor laser
HITACHI LTD46 citations93
US6914381B2Jul 5, 2005
Flat panel display with nanotubes
HITACHI LTD20 citations92
US6542526B1Apr 1, 2003
Optical information processor and semiconductor light emitting device suitable for the same
HITACHI LTD40 citations92
US5177758AJan 5, 1993
Semiconductor laser device with plural active layers and changing optical properties
HITACHI LTD54 citations92
US7976950B2Jul 12, 2011
Transparent conductive film and electronic device including same
HITACHI LTD16 citations83
US5666455ASep 9, 1997
Waveguide device
HITACHI LTD9 citations74
US5572616ANov 5, 1996
Waveguide device
HITACHI LTD12 citations74
US7116291B1Oct 3, 2006
Image display and method of driving image display
HITACHI LTD8 citations73
US6818941B1Nov 16, 2004
Thin film electron emitter, display device using the same and applied machine
HITACHI LTD7 citations73
US6570321B1May 27, 2003
Thin-film electron source, process for manufacturing thin-film electron source, and display
HITACHI LTD7 citations73
US9997771B2Jun 12, 2018
Negative electrode material for lithium ion secondary battery and manufacturing method of the same, negative electrode for lithium ion secondary battery and manufacturing method of the same, and lithium ion secondary battery
HITACHI LTD0 citations52
US7732764B2Jun 8, 2010
Field emission electron gun and electron beam applied device using the same
HITACHI LTD1 citations52
OKAI MAKOTO
5 patentsUS8471237B2Jun 25, 2013
Circuit board including a graphene film having contact region covering a recessed region and a patterned metal film covering the contact region and in direct electrical contact therewith, and device including same
OKAI MAKOTO9 citations83
US8410474B2Apr 2, 2013
Graphene grown substrate and electronic/photonic integrated circuits using same
OKAI MAKOTO18 citations83
US8476739B2Jul 2, 2013
Graphene grown substrate and electronic/photonic integrated circuits using same
OKAI MAKOTO9 citations80
US8507893B2Aug 13, 2013
Electronic device, light-receiving and light-emitting device, electronic integrated circuit and optical integrated circuit using the devices
OKAI MAKOTO3 citations62
US8278658B2Oct 2, 2012
Electrically connected graphene-metal electrode device, and electronic device, electronic integrated circuit and electro-optical integrated circuit using same
OKAI MAKOTO2 citations61
HITACHI DISPLAYS LTD
4 patentsUS7196463B2Mar 27, 2007
Emissive flat panel display having electron sources with high current density and low electric field strength
HITACHI DISPLAYS LTD82 citations97
US7259511B2Aug 21, 2007
Flat panel display device with surfaces of cathodes and control electrodes lying in the same flat plane
HITACHI DISPLAYS LTD5 citations62
US7285901B2Oct 23, 2007
Display device having a connecting portion between cathode line and electron source
HITACHI DISPLAYS LTD0 citations42
US7400083B2Jul 15, 2008
Flat panel display device including electron beam sources and control electrodes
HITACHI DISPLAYS LTD0 citations41
NAKATA TOSHIHIKO
3 patentsUS8181268B2May 15, 2012
Scanning probe microscope and method of observing sample using the same
NAKATA TOSHIHIKO6 citations84
US8635710B2Jan 21, 2014
Scanning probe microscope and method of observing sample using the same
NAKATA TOSHIHIKO2 citations62
US8407811B2Mar 26, 2013
Scanning probe microscope and method of observing sample using the same
NAKATA TOSHIHIKO4 citations62