Inventor

KATO YOSHIHARU

JP90 patents

⚠️ This page may combine multiple inventors who share the name “KATO YOSHIHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KATO YOSHIHARU

FUJITSU LTD

Connectionless communications system, its test method, and intra-station control system

Semiconductor device having test mode entry circuit

Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function

Semiconductor device having test mode entry circuit

Semiconductor memory device

Semiconductor memory, data read method for semiconductor memory and data storage apparatus

Semiconductor memory device and method for reading information of therefrom

Circuit and method for supplying internal power to semiconductor memory device

Internal supply voltage generating cicuit in a semiconductor memory device and method for controlling the same

Semiconductor memory device

Multi chip package structure having a plurality of semiconductor chips mounted in the same package

Semiconductor memory device

Semiconductor memory device having self-refresh function

Semiconductor memory device having flash write function

Intra-station control system for connectionless communications system

Packet data switching system

Semiconductor integrated circuit and method for generating internal supply voltage in semiconductor integrated circuit

Semiconductor memory device and method of controlling the semiconductor memory device

Test method and test circuit for electronic device

Converting circuits and bandwidth management apparatus in mixed network

Drive power supplying method for semiconductor memory device and semiconductor memory device

Semiconductor device

Charge pump circuit with bypass transistor

Semiconductor memory device and method for setting stress voltage

Semiconductor memory device

Memory device and internal control method therefor

Word-line deficiency detection method for semiconductor memory device

Test method and test circuit for electronic device

Data access method of semiconductor memory device and semiconductor memory device

Semiconductor memory device and control method thereof

Semiconductor memory device and control method thereof

Semiconductor memory device capable of performing an overall test thereon at a shortened time period

Voltage reducing circuit

Current mirror amplifier circuit and method of driving the same

Semiconductor memory device, refresh control method thereof, and test method thereof

Memory control device and memory control method

Word-line deficiency detection method for semiconductor memory device

Semiconductor integrated circuit

MURATA MANUFACTURING CO

Process for preparing a particulate ceramic material

Temperature compensating titanate ceramic capacitor with nickel or copper electroless metal electrodes

Apparatus for manufacturing a laminated unit of ceramic green sheets

Process for preparing powdered ceramic raw materials of complex oxide

FUJI ELECTRIC CO LTD

Semiconductor device

Semiconductor device

IBM

Data processing system and data processing method

NIPPON DENSO CO

System for controlling a vehicle-mounted air conditioner

IZUMO IND CO LTS

Tap

JAPAN ATOMIC ENERGY RES INST

Method of measuring the absorption spectra of solutions by laser induced photothermal displacement spectroscopy

FUNAI ELECTRIC CO

Liquid crystal television and liquid crystal display apparatus

CADENCE DESIGN SYSTEMS INC

Method and system for efficient re-determination of a data valid window