Inventor
OKUTA MICHITAKA
JP14 patents
⚠️ This page may combine multiple inventors who share the name “OKUTA MICHITAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KYOCERA CORP
8 patentsUS6658189B2Dec 2, 2003
Broadband amplified spontaneous emission light source
KYOCERA CORP63 citations94
US5452122ASep 19, 1995
Element for optical isolator and optical isolator employing the same, together with semiconductor laser module employing the optical isolator element
KYOCERA CORP46 citations93
US5402260AMar 28, 1995
Element for optical isolator and optical isolator employing the same, together with semiconductor laser module employing the optical isolator element
KYOCERA CORP19 citations79
US6208457B1Mar 27, 2001
Optical fiber coupler, method for producing the same and optical amplifier using the same
KYOCERA CORP10 citations73
US5802224ASep 1, 1998
Optical coupler for performing light branching and light mixing/branch filtering in a light communication network
KYOCERA CORP16 citations69
US5410626AApr 25, 1995
Optical coupler having a tapered fused region
KYOCERA CORP13 citations67
US7366366B2Apr 29, 2008
FBG sensing system
KYOCERA CORP5 citations62
US6992825B2Jan 31, 2006
Volume phase grating, a method for producing such a volume phase grating, an optical module and a semiconductor laser module using such a volume phase grating
KYOCERA CORP1 citations51
NIHON MICRONICS KK
6 patentsUS11624679B2Apr 11, 2023
Optical probe, optical probe array, test system and test method
NIHON MICRONICS KK2 citations71
US11971431B2Apr 30, 2024
Optical probe, optical probe array, optical probe card, and method of manufacturing optical probe
NIHON MICRONICS KK2 citations70
US11971296B2Apr 30, 2024
Measurement system and measurement method
NIHON MICRONICS KK2 citations70
US12360155B2Jul 15, 2025
Optical probe, probe card, measuring system, and measuring method
NIHON MICRONICS KK0 citations60
US12031921B2Jul 9, 2024
Measurement system
NIHON MICRONICS KK1 citations60
US12379398B2Aug 5, 2025
Measurement system
NIHON MICRONICS KK0 citations50