Inventor
LEVITT MARC E
US13 patents
Patents
13 patentsUS5787012AJul 28, 1998
Integrated circuit with identification signal writing circuitry distributed on multiple metal layers
SUN MICROSYSTEMS INC64 citations95
US5898702AApr 27, 1999
Mutual exclusivity circuit for use in test pattern application scan architecture circuits
SUN MICROSYSTEMS INC23 citations92
US5774474AJun 30, 1998
Pipelined scan enable for fast scan testing
SUN MICROSYSTEMS INC45 citations92
US5513186AApr 30, 1996
Method and apparatus for interconnect testing without speed degradation
SUN MICROSYSTEMS INC26 citations92
US5341382AAug 23, 1994
Method and apparatus for improving fault coverage of system logic of an integrated circuit with embedded memory arrays
SUN MICROSYSTEMS INC42 citations92
US5900757AMay 4, 1999
Clock stopping schemes for data buffer
SUN MICROSYSTEMS INC52 citations87
US5864564AJan 26, 1999
Control circuit for deterministic stopping of an integrated circuit internal clock
SUN MICROSYSTEMS INC20 citations86
US6081913AJun 27, 2000
Method for ensuring mutual exclusivity of selected signals during application of test patterns
SUN MICROSYSTEMS INC17 citations83
US5872796AFeb 16, 1999
Method for interfacing boundary-scan circuitry with linearized impedance control type output drivers
SUN MICROSYSTEMS INC8 citations72
US5870408AFeb 9, 1999
Method and apparatus for on die testing
SUN MICROSYSTEMS INC13 citations69
US5379303AJan 3, 1995
Maximizing improvement to fault coverage of system logic of an integrated circuit with embedded memory arrays
SUN MICROSYSTEMS INC3 citations62
US5892778AApr 6, 1999
Boundary-scan circuit for use with linearized impedance control type output drivers
SUN MICROSYSTEMS INC4 citations61
US5528165AJun 18, 1996
Logic signal validity verification apparatus
SUN MICROSYSTEMS INC5 citations58