Inventor
WEI KUO-HSIU
TW23 patents
⚠️ This page may combine multiple inventors who share the name “WEI KUO-HSIU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
13 patentsUS9931726B2Apr 3, 2018
Wafer edge trimming tool using abrasive tape
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11482450B2Oct 25, 2022
Methods of forming an abrasive slurry and methods for chemical- mechanical polishing
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US11211289B2Dec 28, 2021
Metal loss prevention using implantation
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10937691B2Mar 2, 2021
Methods of forming an abrasive slurry and methods for chemical-mechanical polishing
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10643892B2May 5, 2020
Metal loss prevention using implantation
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12068195B2Aug 20, 2024
Metal loss prevention using implantation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11710659B2Jul 25, 2023
Metal loss prevention using implantation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12550695B2Feb 10, 2026
Methods of forming an abrasive slurry and methods for chemical-mechanical polishing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11728172B2Aug 15, 2023
Wafer thinning apparatus having feedback control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11532514B2Dec 20, 2022
Structure and formation method of semiconductor device with conductive feature
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10957587B2Mar 23, 2021
Structure and formation method of semiconductor device with conductive feature
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US9566683B2Feb 14, 2017
Method for wafer grinding
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9829806B2Nov 28, 2017
Lithography tool with backside polisher
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
TAIWAN SEMICONDUCTOR MFG
4 patentsUS6828226B1Dec 7, 2004
Removal of SiON residue after CMP
TAIWAN SEMICONDUCTOR MFG24 citations90
US6769959B2Aug 3, 2004
Method and system for slurry usage reduction in chemical mechanical polishing
TAIWAN SEMICONDUCTOR MFG7 citations72
US9339912B2May 17, 2016
Wafer polishing tool using abrasive tape
TAIWAN SEMICONDUCTOR MFG2 citations62
US8049213B2Nov 1, 2011
Feature dimension measurement
TAIWAN SEMICONDUCTOR MFG0 citations51
KUO CHUN-TING
3 patentsUS9064770B2Jun 23, 2015
Methods for minimizing edge peeling in the manufacturing of BSI chips
KUO CHUN-TING10 citations83
US9676114B2Jun 13, 2017
Wafer edge trim blade with slots
KUO CHUN-TING5 citations72
US9570311B2Feb 14, 2017
Modular grinding apparatuses and methods for wafer thinning
KUO CHUN-TING5 citations72