Inventor
KU TAE-HUNG
KR23 patents
⚠️ This page may combine multiple inventors who share the name “KU TAE-HUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TECHWING CO LTD
14 patentsUS7954869B2Jun 7, 2011
Pick and place apparatus
TECHWING CO LTD23 citations92
US7948255B2May 24, 2011
Test handler
TECHWING CO LTD18 citations92
US8038191B2Oct 18, 2011
Pick and place apparatus
TECHWING CO LTD13 citations83
US7538542B2May 26, 2009
Test handler and operation method thereof
TECHWING CO LTD6 citations73
US7923989B2Apr 12, 2011
Test handler
TECHWING CO LTD2 citations62
US7723981B2May 25, 2010
Method for transferring test trays in a side-docking type test handler
TECHWING CO LTD2 citations62
US8013620B2Sep 6, 2011
Test handler and loading method thereof
TECHWING CO LTD3 citations61
US7667453B2Feb 23, 2010
Test tray for test handler
TECHWING CO LTD2 citations61
US7656150B2Feb 2, 2010
Test handler and loading method thereof
TECHWING CO LTD5 citations61
US8026735B2Sep 27, 2011
Test handler
TECHWING CO LTD2 citations60
US7557564B2Jul 7, 2009
Test handler comprising at least one opening unit opening one part of the plurality of inserts
TECHWING CO LTD4 citations60
US7741836B2Jun 22, 2010
Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handler
TECHWING CO LTD3 citations58
US8376431B2Feb 19, 2013
Pick-and-place module for test handler
TECHWING CO LTD3 citations57
US7898271B2Mar 1, 2011
Position changing apparatus for test handler and power transferring apparatus
TECHWING CO LTD1 citations52
SHIM JAE-GYUN
4 patentsUS8258804B2Sep 4, 2012
Test tray for test handler
SHIM JAE-GYUN3 citations60
US8653845B2Feb 18, 2014
Test handler and method for operating the same for testing semiconductor devices
SHIM JAE-GYUN1 citations51
US8159252B2Apr 17, 2012
Test handler and method for operating the same for testing semiconductor devices
SHIM JAE-GYUN0 citations51
US8058890B2Nov 15, 2011
Test Handler
SHIM JAE-GYUN0 citations51
NA YUN-SUNG
3 patentsUS8496113B2Jul 30, 2013
Insert for carrier board of test handler
NA YUN-SUNG7 citations82
US8558569B2Oct 15, 2013
Opener for test handler
NA YUN-SUNG0 citations39
US8333083B2Dec 18, 2012
System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the system
NA YUN-SUNG0 citations36