P

Inventor

KAMADA TAKAHIRO

JP18 patents
⚠️ This page may combine multiple inventors who share the name “KAMADA TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEIKO EPSON CORP

15 patents
US12020094B2Jun 25, 2024

Image processing device, printing system, and non-transitory computer-readable storage medium storing image processing program that render three dimensional (3D) object

SEIKO EPSON CORP0 citations62
US11989473B1May 21, 2024

Image processing device, printing system, and non-transitory computer-readable storage medium storing image processing program

SEIKO EPSON CORP1 citations62
US11895283B2Feb 6, 2024

Image analyzer determines in-use ink information using image data according to preset conditions and acquires prespecified image quality information when image is printed

SEIKO EPSON CORP0 citations62
US11579816B2Feb 14, 2023

Printing condition setting method, printing condition setting system

SEIKO EPSON CORP0 citations62
US11539862B2Dec 27, 2022

Image processing for color matching before and after lamination printing

SEIKO EPSON CORP0 citations57
US11477348B2Oct 18, 2022

Printing device and printing method

SEIKO EPSON CORP1 citations57
US12486131B2Dec 2, 2025

Print medium identification method and print medium identification system

SEIKO EPSON CORP0 citations51
US12481853B2Nov 25, 2025

Image processing device and image processing program

SEIKO EPSON CORP0 citations51
US12321648B2Jun 3, 2025

Image processing device for previewing image to be printed on 3D object

SEIKO EPSON CORP0 citations51
US11909938B2Feb 20, 2024

Printing method including gradation region ink amount calculation step

SEIKO EPSON CORP0 citations51
US11616892B2Mar 28, 2023

Printing system, print medium specifying method, and medium information providing device

SEIKO EPSON CORP0 citations51
US12597120B2Apr 7, 2026

Printed image defect discrimination device and method displaying detected defects in list by type in display mode according to state of defect

SEIKO EPSON CORP0 citations50
US12423802B2Sep 23, 2025

Defect discrimination apparatus for printed images and defect discrimination method

SEIKO EPSON CORP0 citations50
US11849095B2Dec 19, 2023

Profile creation device and method generating and displaying input and output device color gamuts as 3D images

SEIKO EPSON CORP0 citations48
US10496349B2Dec 3, 2019

Profile adjustment system, profile adjustment device, and profile adjustment method

SEIKO EPSON CORP0 citations41

PIONEER CORP

2 patents

SUGISAWA KOUTAROU

1 patent