Inventor
MEASOR PHILIP
US6 patents
⚠️ This page may combine multiple inventors who share the name “MEASOR PHILIP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
5 patentsUS10887580B2Jan 5, 2021
Three-dimensional imaging for semiconductor wafer inspection
KLA TENCOR CORP8 citations82
US11047806B2Jun 29, 2021
Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures
KLA TENCOR CORP8 citations78
US10928740B2Feb 23, 2021
Three-dimensional calibration structures and methods for measuring buried defects on a three-dimensional semiconductor wafer
KLA TENCOR CORP0 citations60
US10249546B2Apr 2, 2019
Reverse decoration for defect detection amplification
KLA TENCOR CORP0 citations49
US10018571B2Jul 10, 2018
System and method for dynamic care area generation on an inspection tool
KLA TENCOR CORP0 citations36