Inventor
LU XUESONG
US19 patents
⚠️ This page may combine multiple inventors who share the name “LU XUESONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
14 patentsUS11562909B2Jan 24, 2023
Directional selective junction clean with field polymer protections
APPLIED MATERIALS INC2 citations72
US9881787B2Jan 30, 2018
Deposition methods for uniform and conformal hybrid titanium oxide films
APPLIED MATERIALS INC2 citations69
US11749543B2Sep 5, 2023
Chamber matching and calibration
APPLIED MATERIALS INC2 citations67
US12463052B2Nov 4, 2025
Directional selective junction clean with field polymer protections
APPLIED MATERIALS INC0 citations61
US12347695B2Jul 1, 2025
Methods for controlling contact resistance in cobalt-titanium structures
APPLIED MATERIALS INC0 citations61
US11830725B2Nov 28, 2023
Method of cleaning a structure and method of depositing a capping layer in a structure
APPLIED MATERIALS INC0 citations61
US11424132B2Aug 23, 2022
Methods and apparatus for controlling contact resistance in cobalt-titanium structures
APPLIED MATERIALS INC0 citations61
US10208380B2Feb 19, 2019
Advanced coating method and materials to prevent HDP-CVD chamber arcing
APPLIED MATERIALS INC1 citations60
US10192763B2Jan 29, 2019
Methodology for chamber performance matching for semiconductor equipment
APPLIED MATERIALS INC1 citations60
US10883932B2Jan 5, 2021
Advanced in-situ particle detection system for semiconductor substrate processing systems
APPLIED MATERIALS INC0 citations57
US10655223B2May 19, 2020
Advanced coating method and materials to prevent HDP-CVD chamber arcing
APPLIED MATERIALS INC0 citations50
US10002745B2Jun 19, 2018
Plasma treatment process for in-situ chamber cleaning efficiency enhancement in plasma processing chamber
APPLIED MATERIALS INC1 citations50
US12068180B2Aug 20, 2024
Advanced temperature monitoring system and methods for semiconductor manufacture productivity
APPLIED MATERIALS INC0 citations48
US10365216B2Jul 30, 2019
Advanced in-situ particle detection system for semiconductor substrate processing systems
APPLIED MATERIALS INC0 citations46
PETROCHINA CO LTD
5 patentsUS10184904B1Jan 22, 2019
Core holder for micron CT observation and experimental method thereof
PETROCHINA CO LTD8 citations79
US11268944B2Mar 8, 2022
Method for determining gas saturation of tight reservoir
PETROCHINA CO LTD0 citations48
US10884155B2Jan 5, 2021
Method and apparatus for measuring oil content of tight reservoir based on nuclear magnetic resonance
PETROCHINA CO LTD0 citations45
US10598595B2Mar 24, 2020
Method for determining oil contents in rock formations
PETROCHINA CO LTD0 citations35
US10533944B2Jan 14, 2020
Method for determining maturity in oil source rock by total scanning fluorescence and the device therefor
PETROCHINA CO LTD0 citations33