P

Inventor

LU XUESONG

US19 patents
⚠️ This page may combine multiple inventors who share the name “LU XUESONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

14 patents
US11562909B2Jan 24, 2023

Directional selective junction clean with field polymer protections

APPLIED MATERIALS INC2 citations72
US9881787B2Jan 30, 2018

Deposition methods for uniform and conformal hybrid titanium oxide films

APPLIED MATERIALS INC2 citations69
US11749543B2Sep 5, 2023

Chamber matching and calibration

APPLIED MATERIALS INC2 citations67
US12463052B2Nov 4, 2025

Directional selective junction clean with field polymer protections

APPLIED MATERIALS INC0 citations61
US12347695B2Jul 1, 2025

Methods for controlling contact resistance in cobalt-titanium structures

APPLIED MATERIALS INC0 citations61
US11830725B2Nov 28, 2023

Method of cleaning a structure and method of depositing a capping layer in a structure

APPLIED MATERIALS INC0 citations61
US11424132B2Aug 23, 2022

Methods and apparatus for controlling contact resistance in cobalt-titanium structures

APPLIED MATERIALS INC0 citations61
US10208380B2Feb 19, 2019

Advanced coating method and materials to prevent HDP-CVD chamber arcing

APPLIED MATERIALS INC1 citations60
US10192763B2Jan 29, 2019

Methodology for chamber performance matching for semiconductor equipment

APPLIED MATERIALS INC1 citations60
US10883932B2Jan 5, 2021

Advanced in-situ particle detection system for semiconductor substrate processing systems

APPLIED MATERIALS INC0 citations57
US10655223B2May 19, 2020

Advanced coating method and materials to prevent HDP-CVD chamber arcing

APPLIED MATERIALS INC0 citations50
US10002745B2Jun 19, 2018

Plasma treatment process for in-situ chamber cleaning efficiency enhancement in plasma processing chamber

APPLIED MATERIALS INC1 citations50
US12068180B2Aug 20, 2024

Advanced temperature monitoring system and methods for semiconductor manufacture productivity

APPLIED MATERIALS INC0 citations48
US10365216B2Jul 30, 2019

Advanced in-situ particle detection system for semiconductor substrate processing systems

APPLIED MATERIALS INC0 citations46

PETROCHINA CO LTD

5 patents