Inventor

LEE DAL-HEE

KR21 patents

⚠️ This page may combine multiple inventors who share the name “LEE DAL-HEE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE DAL-HEE

SAMSUNG ELECTRONICS CO LTD

Methods of generating integrated circuit layout using standard cell library

Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits

Semiconductor device having decoupling capacitors and dummy transistors

Integrated circuit including interconnection and method of fabricating the same, the interconnection including a pattern shaped and/or a via disposed for mitigating electromigration

Integrated circuit including multiple-height cell and method of manufacturing the integrated circuit

Standard cell for removing routing interference between adjacent pins and device including the same

Integrated circuit and semiconductor device including the same

Integrated circuit and semiconductor device including the same

Integrated circuit and semiconductor device including the same

Scan flip-flop and scan test circuit including the same

Latch circuit, flip-flop circuit including the same

Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits

Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits

Engineering change order (ECO) cell, layout thereof and integrated circuit including the ECO cell

Scan flip-flop and scan test circuit including the same

Integrated circuit including interconnection and method of fabricating the same, the interconnection including a pattern shaped for mitigating electromigration

Standard cell for removing routing interference between adjacent pins and device including the same

Latch circuit, flip-flop circuit including the same

Methods of generating integrated circuit layout using standard cell library

Method and program for designing integrated circuit

KIM HA-YOUNG

Scan flip-flop and scan test circuit including the same