P

Inventor

KIM CHANG SIK

KR33 patents
⚠️ This page may combine multiple inventors who share the name “KIM CHANG SIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

12 patents
US6041733AMar 28, 2000

Plasma processing apparatus protected from discharges in association with secondary potentials

SAMSUNG ELECTRONICS CO LTD32 citations88
US9853378B2Dec 26, 2017

Substrate and terminals for power module and power module including the same

SAMSUNG ELECTRONICS CO LTD13 citations84
US7612573B2Nov 3, 2009

Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads

SAMSUNG ELECTRONICS CO LTD10 citations81
US10057673B2Aug 21, 2018

Electronic device and operating method thereof

SAMSUNG ELECTRONICS CO LTD4 citations71
US5748297AMay 5, 1998

Endpoint detecting apparatus in a plasma etching system

SAMSUNG ELECTRONICS CO LTD16 citations71
US7616020B2Nov 10, 2009

Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device

SAMSUNG ELECTRONICS CO LTD5 citations70
US10452063B2Oct 22, 2019

Method, storage medium, and electronic device for controlling unmanned aerial vehicle

SAMSUNG ELECTRONICS CO LTD2 citations66
US10693969B2Jun 23, 2020

Electronic device using logical channels for communication

SAMSUNG ELECTRONICS CO LTD4 citations64
US10193250B2Jan 29, 2019

Substrate and terminals for power module and power module including the same

SAMSUNG ELECTRONICS CO LTD1 citations62
US7971117B2Jun 28, 2011

Test circuits of semiconductor memory device for multi-chip testing and method for testing multi chips

SAMSUNG ELECTRONICS CO LTD5 citations62
US6822914B2Nov 23, 2004

Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory device

SAMSUNG ELECTRONICS CO LTD4 citations61
US7880493B2Feb 1, 2011

Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations59

SAMSUNG ELECTRO MECH

7 patents

GCS CO LTD

6 patents

SAMSUNG DISPLAY CO LTD

3 patents

SAMSUNG SDI CO LTD

1 patent

HYUN DAI HEAVY IND CO LTD

1 patent

PYUN YOUNG SIK

1 patent

SAMSUNG TECHWIN CO LTD

1 patent

HYUNDAI MOTOR CO LTD

1 patent