Inventor
LIU YANXIANG
CN61 patents
⚠️ This page may combine multiple inventors who share the name “LIU YANXIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
24 patentsUS9087860B1Jul 21, 2015
Fabricating fin-type field effect transistor with punch-through stop region
GLOBALFOUNDRIES INC23 citations91
US9640538B2May 2, 2017
Embedded DRAM in replacement metal gate technology
GLOBALFOUNDRIES INC8 citations84
US9673757B2Jun 6, 2017
Modified tunneling field effect transistors and fabrication methods
GLOBALFOUNDRIES INC3 citations73
US9142316B2Sep 22, 2015
Embedded selector-less one-time programmable non-volatile memory
GLOBALFOUNDRIES INC5 citations73
US9406752B2Aug 2, 2016
FinFET conformal junction and high EPI surface dopant concentration method and device
GLOBALFOUNDRIES INC3 citations72
US9472554B2Oct 18, 2016
Integrated circuits having FinFET semiconductor devices and methods of fabricating the same to resist sub-fin current leakage
GLOBALFOUNDRIES INC6 citations71
US9064868B2Jun 23, 2015
Advanced faraday shield for a semiconductor device
GLOBALFOUNDRIES INC4 citations69
US9142640B1Sep 22, 2015
Containment structure for epitaxial growth in non-planar semiconductor structure
GLOBALFOUNDRIES INC3 citations63
US9087743B2Jul 21, 2015
Silicon-on-insulator finFET with bulk source and drain
GLOBALFOUNDRIES INC2 citations63
US9437740B2Sep 6, 2016
Epitaxially forming a set of fins in a semiconductor device
GLOBALFOUNDRIES INC2 citations61
US10170315B2Jan 1, 2019
Semiconductor device having local buried oxide
GLOBALFOUNDRIES INC0 citations52
US10003302B2Jun 19, 2018
Modified tunneling field effect transistors and fabrication methods
GLOBALFOUNDRIES INC0 citations52
US9397191B2Jul 19, 2016
Methods of making a self-aligned channel drift device
GLOBALFOUNDRIES INC0 citations52
US9385126B2Jul 5, 2016
Silicon-on-insulator finFET with bulk source and drain
GLOBALFOUNDRIES INC0 citations52
US9252272B2Feb 2, 2016
FinFET semiconductor device having local buried oxide
GLOBALFOUNDRIES INC1 citations52
US9202911B2Dec 1, 2015
Self-aligned channel drift device and methods of making such a device
GLOBALFOUNDRIES INC0 citations52
US9064888B2Jun 23, 2015
Forming tunneling field-effect transistor with stacking fault and resulting device
GLOBALFOUNDRIES INC0 citations52
US9007803B2Apr 14, 2015
Integrated circuits with programmable electrical connections and methods for fabricating the same
GLOBALFOUNDRIES INC0 citations52
US8846476B2Sep 30, 2014
Methods of forming multiple N-type semiconductor devices with different threshold voltages on a semiconductor substrate
GLOBALFOUNDRIES INC1 citations52
US9601578B2Mar 21, 2017
Non-planar vertical dual source drift metal-oxide semiconductor (VDSMOS)
GLOBALFOUNDRIES INC0 citations51
US9577040B2Feb 21, 2017
FinFET conformal junction and high epi surface dopant concentration method and device
GLOBALFOUNDRIES INC1 citations51
US9559176B2Jan 31, 2017
FinFET conformal junction and abrupt junction with reduced damage method and device
GLOBALFOUNDRIES INC0 citations51
US9397162B1Jul 19, 2016
FinFET conformal junction and abrupt junction with reduced damage method and device
GLOBALFOUNDRIES INC0 citations51
US9034737B2May 19, 2015
Epitaxially forming a set of fins in a semiconductor device
GLOBALFOUNDRIES INC1 citations51
QUALCOMM INC
12 patentsUS9570442B1Feb 14, 2017
Applying channel stress to Fin field-effect transistors (FETs) (FinFETs) using a self-aligned single diffusion break (SDB) isolation structure
QUALCOMM INC58 citations98
US9853112B2Dec 26, 2017
Device and method to connect gate regions separated using a gate cut
QUALCOMM INC7 citations84
US9653466B2May 16, 2017
FinFET device and method of making the same
QUALCOMM INC15 citations84
US9537007B2Jan 3, 2017
FinFET with cut gate stressor
QUALCOMM INC12 citations84
US10833017B2Nov 10, 2020
Contact for semiconductor device
QUALCOMM INC4 citations73
US10141306B2Nov 27, 2018
Systems, methods, and apparatus for improved finFETs
QUALCOMM INC2 citations73
US10134734B2Nov 20, 2018
Fin field effect transistor (FET) (FinFET) complementary metal oxide semiconductor (CMOS) circuits employing single and double diffusion breaks for increased performance
QUALCOMM INC5 citations73
US10062763B2Aug 28, 2018
Method and apparatus for selectively forming nitride caps on metal gate
QUALCOMM INC6 citations73
US9607988B2Mar 28, 2017
Off-center gate cut
QUALCOMM INC4 citations73
US10181403B2Jan 15, 2019
Layout effect mitigation in FinFET
QUALCOMM INC0 citations52
US9997360B2Jun 12, 2018
Method for mitigating layout effect in FINFET
QUALCOMM INC1 citations52
US9653281B2May 16, 2017
Structure and method for tunable memory cells including fin field effect transistors
QUALCOMM INC1 citations52
LIU YANXIANG
6 patentsUS8809178B2Aug 19, 2014
Methods of forming bulk FinFET devices with replacement gates so as to reduce punch through leakage currents
LIU YANXIANG13 citations81
US8809962B2Aug 19, 2014
Transistor with reduced parasitic capacitance
LIU YANXIANG4 citations72
US8637372B2Jan 28, 2014
Methods for fabricating a FINFET integrated circuit on a bulk silicon substrate
LIU YANXIANG5 citations72
US8956948B2Feb 17, 2015
Shallow trench isolation extension
LIU YANXIANG0 citations51
US8841732B2Sep 23, 2014
Self-adjusting latch-up resistance for CMOS devices
LIU YANXIANG1 citations51
US8691646B2Apr 8, 2014
FINFET compatible PC-bounded ESD diode
LIU YANXIANG0 citations51
HUAWEI TECH CO LTD
2 patentsGLOBAL FOUNDRIES INC
1 patentSPANSION LLC
1 patentSENNICS CO LTD
1 patentIBM
1 patentGLOBALFOUNDRIES SG PTE LTD
1 patentCRRC TANGSHAN CO LTD
1 patentShowing the top 50 of 61 patents by PatentIndex Score.