Inventor

MASUTA HIKARU

JP5 patents

⚠️ This page may combine multiple inventors who share the name “MASUTA HIKARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO SEIMITSU CO LTD

2 patents

US10041779B2Aug 7, 2018

Surface shape measuring method, misalignment amount calculating method, and surface shape measuring device

TOKYO SEIMITSU CO LTD6 citations68

US12373974B2Jul 29, 2025

Shape measurement device and method for controlling same

TOKYO SEIMITSU CO LTD0 citations49

NIHON MICRONICS KK

2 patents

US9069008B2Jun 30, 2015

Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodes

NIHON MICRONICS KK5 citations66

US9146256B2Sep 29, 2015

Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling device

NIHON MICRONICS KK1 citations42

WASHIO KENICHI

1 patent

US8471586B2Jun 25, 2013

Wafer prober for semiconductor inspection and inspection method

WASHIO KENICHI1 citations45