Inventor
ORLOWSKI MARIUS K
US60 patents
⚠️ This page may combine multiple inventors who share the name “ORLOWSKI MARIUS K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
43 patentsUS7226833B2Jun 5, 2007
Semiconductor device structure and method therefor
FREESCALE SEMICONDUCTOR INC124 citations99
US6921700B2Jul 26, 2005
Method of forming a transistor having multiple channels
FREESCALE SEMICONDUCTOR INC96 citations98
US7238580B2Jul 3, 2007
Semiconductor fabrication process employing stress inducing source drain structures with graded impurity concentration
FREESCALE SEMICONDUCTOR INC59 citations97
US6831350B1Dec 14, 2004
Semiconductor structure with different lattice constant materials and method for forming the same
FREESCALE SEMICONDUCTOR INC89 citations97
US7112832B2Sep 26, 2006
Transistor having multiple channels
FREESCALE SEMICONDUCTOR INC51 citations96
US7592248B2Sep 22, 2009
Method of forming semiconductor device having nanotube structures
FREESCALE SEMICONDUCTOR INC34 citations93
US7354831B2Apr 8, 2008
Multi-channel transistor structure and method of making thereof
FREESCALE SEMICONDUCTOR INC40 citations93
US7339241B2Mar 4, 2008
FinFET structure with contacts
FREESCALE SEMICONDUCTOR INC42 citations93
US7238555B2Jul 3, 2007
Single transistor memory cell with reduced programming voltages
FREESCALE SEMICONDUCTOR INC29 citations93
US7037795B1May 2, 2006
Low RC product transistors in SOI semiconductor process
FREESCALE SEMICONDUCTOR INC26 citations93
US7435639B2Oct 14, 2008
Dual surface SOI by lateral epitaxial overgrowth
FREESCALE SEMICONDUCTOR INC34 citations92
US7166897B2Jan 23, 2007
Method and apparatus for performance enhancement in an asymmetrical semiconductor device
FREESCALE SEMICONDUCTOR INC19 citations92
US7029980B2Apr 18, 2006
Method of manufacturing SOI template layer
FREESCALE SEMICONDUCTOR INC25 citations92
US7968394B2Jun 28, 2011
Transistor with immersed contacts and methods of forming thereof
FREESCALE SEMICONDUCTOR INC9 citations84
US7544576B2Jun 9, 2009
Diffusion barrier for nickel silicides in a semiconductor fabrication process
FREESCALE SEMICONDUCTOR INC11 citations84
US7456055B2Nov 25, 2008
Process for forming an electronic device including semiconductor fins
FREESCALE SEMICONDUCTOR INC10 citations84
US7256077B2Aug 14, 2007
Method for removing a semiconductor layer
FREESCALE SEMICONDUCTOR INC12 citations84
US7163903B2Jan 16, 2007
Method for making a semiconductor structure using silicon germanium
FREESCALE SEMICONDUCTOR INC10 citations84
US7045432B2May 16, 2006
Method for forming a semiconductor device with local semiconductor-on-insulator (SOI)
FREESCALE SEMICONDUCTOR INC14 citations84
US7932189B2Apr 26, 2011
Process of forming an electronic device including a layer of discontinuous storage elements
FREESCALE SEMICONDUCTOR INC16 citations82
US7442621B2Oct 28, 2008
Semiconductor process for forming stress absorbent shallow trench isolation structures
FREESCALE SEMICONDUCTOR INC10 citations82
US7811891B2Oct 12, 2010
Method to control the gate sidewall profile by graded material composition
FREESCALE SEMICONDUCTOR INC17 citations80
US7772584B2Aug 10, 2010
Laterally grown nanotubes and method of formation
FREESCALE SEMICONDUCTOR INC5 citations74
US7371677B2May 13, 2008
Laterally grown nanotubes and method of formation
FREESCALE SEMICONDUCTOR INC5 citations74
US7354814B2Apr 8, 2008
Semiconductor process with first transistor types oriented in a first plane and second transistor types oriented in a second plane
FREESCALE SEMICONDUCTOR INC8 citations74
US7312129B2Dec 25, 2007
Method for producing two gates controlling the same channel
FREESCALE SEMICONDUCTOR INC7 citations74
US7202117B2Apr 10, 2007
Method of making a planar double-gated transistor
FREESCALE SEMICONDUCTOR INC9 citations74
US6964911B2Nov 15, 2005
Method for forming a semiconductor device having isolation regions
FREESCALE SEMICONDUCTOR INC10 citations74
US7986006B2Jul 26, 2011
Single transistor memory cell with reduced recombination rates
FREESCALE SEMICONDUCTOR INC4 citations63
US7939412B2May 10, 2011
Process for forming an electronic device including a fin-type transistor structure
FREESCALE SEMICONDUCTOR INC4 citations63
US7781840B2Aug 24, 2010
Semiconductor device structure
FREESCALE SEMICONDUCTOR INC4 citations63
US7723805B2May 25, 2010
Electronic device including a fin-type transistor structure and a process for forming the electronic device
FREESCALE SEMICONDUCTOR INC2 citations63
US7575958B2Aug 18, 2009
Programmable fuse with silicon germanium
FREESCALE SEMICONDUCTOR INC6 citations63
US7535060B2May 19, 2009
Charge storage structure formation in transistor with vertical channel region
FREESCALE SEMICONDUCTOR INC2 citations63
US7517741B2Apr 14, 2009
Single transistor memory cell with reduced recombination rates
FREESCALE SEMICONDUCTOR INC5 citations63
US7442590B2Oct 28, 2008
Method for forming a semiconductor device having a fin and structure thereof
FREESCALE SEMICONDUCTOR INC6 citations63
US7195963B2Mar 27, 2007
Method for making a semiconductor structure using silicon germanium
FREESCALE SEMICONDUCTOR INC2 citations63
US7135379B2Nov 14, 2006
Isolation trench perimeter implant for threshold voltage control
FREESCALE SEMICONDUCTOR INC3 citations63
US7105430B2Sep 12, 2006
Method for forming a semiconductor device having a notched control electrode and structure thereof
FREESCALE SEMICONDUCTOR INC5 citations63
US7928502B2Apr 19, 2011
Transistor devices with nano-crystal gate structures
FREESCALE SEMICONDUCTOR INC2 citations62
US7700438B2Apr 20, 2010
MOS device with nano-crystal gate structure
FREESCALE SEMICONDUCTOR INC5 citations62
US7205202B2Apr 17, 2007
Semiconductor device and method for regional stress control
FREESCALE SEMICONDUCTOR INC3 citations62
US7291521B2Nov 6, 2007
Self correcting suppression of threshold voltage variation in fully depleted transistors
FREESCALE SEMICONDUCTOR INC4 citations61
MOTOROLA INC
5 patentsUS5705415AJan 6, 1998
Process for forming an electrically programmable read-only memory cell
MOTOROLA INC290 citations99
US5314834AMay 24, 1994
Field effect transistor having a gate dielectric with variable thickness
MOTOROLA INC99 citations96
US5985736ANov 16, 1999
Process for forming field isolation
MOTOROLA INC17 citations91
US5432118AJul 11, 1995
Process for forming field isolation
MOTOROLA INC31 citations91
US5741736AApr 21, 1998
Process for forming a transistor with a nonuniformly doped channel
MOTOROLA INC49 citations89
ORLOWSKI MARIUS K
2 patentsShowing the top 50 of 60 patents by PatentIndex Score.