Inventor
GE ZONGTAO
JP16 patents
⚠️ This page may combine multiple inventors who share the name “GE ZONGTAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJINON CORP
9 patentsUS6947149B2Sep 20, 2005
Method of assisting sample inclination error adjustment
FUJINON CORP11 citations74
US7245384B2Jul 17, 2007
Sample inclination measuring method
FUJINON CORP3 citations63
US7880897B2Feb 1, 2011
Light wave interferometer apparatus
FUJINON CORP4 citations62
US7792366B1Sep 7, 2010
Method of measuring amount of eccentricity
FUJINON CORP5 citations62
US7719691B2May 18, 2010
Wavefront measuring apparatus for optical pickup
FUJINON CORP2 citations62
US7119907B2Oct 10, 2006
Low coherent interference fringe analysis method
FUJINON CORP3 citations62
US6950191B2Sep 27, 2005
Method of extracting circular region from fringe image
FUJINON CORP4 citations62
US7538890B2May 26, 2009
Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof
FUJINON CORP2 citations61
US7982882B2Jul 19, 2011
Optical wave interference measuring apparatus
FUJINON CORP0 citations41
FUJI PHOTO OPTICAL CO LTD
6 patentsUS6532073B2Mar 11, 2003
Fringe analysis error detection method and fringe analysis error correction method
FUJI PHOTO OPTICAL CO LTD19 citations92
US6778281B2Aug 17, 2004
Phase shift fringe analysis method and apparatus using the same
FUJI PHOTO OPTICAL CO LTD14 citations83
US6621579B2Sep 16, 2003
Fringe analysis method and apparatus using Fourier transform
FUJI PHOTO OPTICAL CO LTD16 citations83
US6707559B2Mar 16, 2004
Method of detecting posture of object and apparatus using the same
FUJI PHOTO OPTICAL CO LTD11 citations73
US6768554B2Jul 27, 2004
Fringe analysis method using fourier transform
FUJI PHOTO OPTICAL CO LTD6 citations62
US6693715B2Feb 17, 2004
Fringe analysis method using fourier transform
FUJI PHOTO OPTICAL CO LTD6 citations62