Inventor
NISHIKAWA TAKEICHIRO
JP27 patents
⚠️ This page may combine multiple inventors who share the name “NISHIKAWA TAKEICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
19 patentsUS7123126B2Oct 17, 2006
Method of and computer program product for monitoring person's movements
TOSHIBA KK82 citations97
US6963277B2Nov 8, 2005
Method of and system for monitoring behavior of group of persons, and computer program product
TOSHIBA KK40 citations92
US6122443ASep 19, 2000
Wire length minimization apparatus and method
TOSHIBA KK37 citations92
US5971596AOct 26, 1999
Constraint condition evaluation method and constraint condition evaluation system
TOSHIBA KK30 citations92
US7899767B2Mar 1, 2011
Probabilistic model generation method, apparatus, and program
TOSHIBA KK8 citations82
US10496515B2Dec 3, 2019
Abnormality detection apparatus, abnormality detection method, and non-transitory computer readable medium
TOSHIBA KK7 citations81
US11216741B2Jan 4, 2022
Analysis apparatus, analysis method, and non-transitory computer readable medium
TOSHIBA KK3 citations73
US10203895B2Feb 12, 2019
Storage management apparatus, storage system, and storage management method
TOSHIBA KK2 citations72
US10134437B2Nov 20, 2018
Information memory device, failure predicting device and failure predicting method
TOSHIBA KK5 citations71
US9183067B2Nov 10, 2015
Data preserving apparatus, method and system therefor
TOSHIBA KK4 citations71
US11461515B2Oct 4, 2022
Optimization apparatus, simulation system and optimization method for semiconductor design
TOSHIBA KK4 citations68
US11216534B2Jan 4, 2022
Apparatus, system, and method of covariance estimation based on data missing rate for information processing
TOSHIBA KK2 citations67
US7509282B2Mar 24, 2009
Auction system and method
TOSHIBA KK4 citations61
US9786306B2Oct 10, 2017
Failure prognosis device, method, and storage system
TOSHIBA KK0 citations51
US10095225B2Oct 9, 2018
Quality controlling device and control method thereof
TOSHIBA KK0 citations50
US12000868B2Jun 4, 2024
Waveform segmentation device and waveform segmentation method
TOSHIBA KK0 citations48
US11876021B2Jan 16, 2024
Test circuit and test method
TOSHIBA KK0 citations47
US11137323B2Oct 5, 2021
Method of detecting anomalies in waveforms, and system thereof
TOSHIBA KK0 citations45
US9720759B2Aug 1, 2017
Server, model applicability/non-applicability determining method and non-transitory computer readable medium
TOSHIBA KK0 citations40