Inventor
KASHIMA HIDEO
JP36 patents
⚠️ This page may combine multiple inventors who share the name “KASHIMA HIDEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
25 patentsUS6927391B2Aug 9, 2005
Method and apparatus for processing a micro sample
HITACHI LTD69 citations99
US6781125B2Aug 24, 2004
Method and apparatus for processing a micro sample
HITACHI LTD114 citations99
US6664552B2Dec 16, 2003
Method and apparatus for specimen fabrication
HITACHI LTD139 citations99
US6077027AJun 20, 2000
Semiconductor manufacturing apparatus for transferring articles with a bearing-less joint and method for manufacturing semiconductor device
HITACHI LTD418 citations99
US7550750B2Jun 23, 2009
Method and apparatus for processing a micro sample
HITACHI LTD26 citations96
US7205560B2Apr 17, 2007
Method and apparatus for processing a micro sample
HITACHI LTD32 citations96
US7205554B2Apr 17, 2007
Method and apparatus for processing a micro sample
HITACHI LTD34 citations96
US6794663B2Sep 21, 2004
Method and apparatus for specimen fabrication
HITACHI LTD33 citations96
US7888639B2Feb 15, 2011
Method and apparatus for processing a micro sample
HITACHI LTD14 citations93
US7470918B2Dec 30, 2008
Method and apparatus for processing a micro sample
HITACHI LTD22 citations93
US7465945B2Dec 16, 2008
Method and apparatus for processing a micro sample
HITACHI LTD20 citations93
US7897936B2Mar 1, 2011
Method and apparatus for specimen fabrication
HITACHI LTD15 citations92
US7268356B2Sep 11, 2007
Method and apparatus for specimen fabrication
HITACHI LTD28 citations92
US6884997B2Apr 26, 2005
Method and apparatus for detecting dangerous substances and substances of interest
HITACHI LTD27 citations91
US5971701AOct 26, 1999
Semiconductor manufacturing apparatus for transferring articles with a bearing-less joint and method for manufacturing semiconductor device
HITACHI LTD15 citations82
US9850696B2Dec 26, 2017
Microparticle detection device and security gate
HITACHI LTD4 citations73
US9696288B2Jul 4, 2017
Attached matter testing device and testing method
HITACHI LTD3 citations73
US9261437B2Feb 16, 2016
Attached matter inspection device
HITACHI LTD4 citations73
US9417163B2Aug 16, 2016
Analyzer for substance
HITACHI LTD2 citations63
US7164124B2Jan 16, 2007
Mass spectrometric apparatus and ion source
HITACHI LTD6 citations63
US9214324B2Dec 15, 2015
Analysis device and analysis method
HITACHI LTD3 citations62
US10945684B2Mar 16, 2021
Ultrasonic CT device
HITACHI LTD0 citations51
US9773640B2Sep 26, 2017
Sample holder, charged particle beam apparatus, and observation method
HITACHI LTD1 citations51
US9423388B2Aug 23, 2016
Particle analyzing device
HITACHI LTD1 citations49
US10048172B2Aug 14, 2018
Substance-testing apparatus, substance-testing system, and substance-testing method
HITACHI LTD0 citations41
HITACHI HIGH TECH CORP
4 patentsUS9287084B2Mar 15, 2016
Aberration corrector and charged particle beam apparatus using the same
HITACHI HIGH TECH CORP3 citations71
US11769650B2Sep 26, 2023
Multistage-connected multipole, multistage multipole unit, and charged particle beam device
HITACHI HIGH TECH CORP0 citations55
US8963102B2Feb 24, 2015
Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy
HITACHI HIGH TECH CORP1 citations51
US12354826B2Jul 8, 2025
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations48