Inventor
SIM SANG-PIL
KR30 patents
⚠️ This page may combine multiple inventors who share the name “SIM SANG-PIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
26 patentsUS8878309B1Nov 4, 2014
Semiconductor device having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD105 citations97
US6399476B2Jun 4, 2002
Multilayer passivation process for forming air gaps within a dielectric between interconnections
SAMSUNG ELECTRONICS CO LTD66 citations94
US5447878ASep 5, 1995
Method for manufacturing a semiconductor memory device having a capacitor with increased effective area
SAMSUNG ELECTRONICS CO LTD107 citations94
US5399518AMar 21, 1995
Method for manufacturing a multiple walled capacitor of a semiconductor device
SAMSUNG ELECTRONICS CO LTD88 citations94
US9379106B2Jun 28, 2016
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD18 citations92
US5597763AJan 28, 1997
Method for manufacturing a semiconductor wiring structure including a self-aligned contact hole
SAMSUNG ELECTRONICS CO LTD24 citations92
US6097078AAug 1, 2000
Method for forming triple well in semiconductor device
SAMSUNG ELECTRONICS CO LTD21 citations86
US9141751B2Sep 22, 2015
Method of forming a pattern
SAMSUNG ELECTRONICS CO LTD9 citations84
US7397704B2Jul 8, 2008
Flash memory device and program method thereof
SAMSUNG ELECTRONICS CO LTD11 citations84
US5567989AOct 22, 1996
Highly integrated semiconductor wiring structure
SAMSUNG ELECTRONICS CO LTD15 citations82
US7652925B2Jan 26, 2010
Flash memory device and program method thereof
SAMSUNG ELECTRONICS CO LTD7 citations74
US5915189AJun 22, 1999
Manufacturing method for semiconductor memory device having a storage node with surface irregularities
SAMSUNG ELECTRONICS CO LTD9 citations74
US7586135B2Sep 8, 2009
Multilevel integrated circuit devices and methods of forming the same
SAMSUNG ELECTRONICS CO LTD7 citations73
US10269928B2Apr 23, 2019
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD3 citations72
US10002943B2Jun 19, 2018
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD4 citations72
US7271436B2Sep 18, 2007
Flash memory devices including a pass transistor
SAMSUNG ELECTRONICS CO LTD5 citations63
US6117773ASep 12, 2000
Methods of fabricating microelectronic devices having increased impurity concentration between a metal silicide contact surface
SAMSUNG ELECTRONICS CO LTD4 citations63
US6025617AFeb 15, 2000
Microelectronic devices having increased impurity concentration between a metal silicide contact surface
SAMSUNG ELECTRONICS CO LTD3 citations63
US12336242B2Jun 17, 2025
Semiconductor devices including protruding insulation portions between active fins
SAMSUNG ELECTRONICS CO LTD0 citations62
US11955517B2Apr 9, 2024
Semiconductor devices including protruding insulation portions between active fins
SAMSUNG ELECTRONICS CO LTD0 citations62
US7075142B2Jul 11, 2006
Cell arrays of memory devices having extended source strapping regions
SAMSUNG ELECTRONICS CO LTD3 citations62
US10861934B2Dec 8, 2020
Semiconductor devices including protruding insulation portions between active fins
SAMSUNG ELECTRONICS CO LTD0 citations52
US10319814B2Jun 11, 2019
Semiconductor devices including protruding insulation portions between active fins
SAMSUNG ELECTRONICS CO LTD0 citations52
US7531409B2May 12, 2009
Fabrication method and structure for providing a recessed channel in a nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD1 citations50
US7276415B2Oct 2, 2007
Contactless nonvolatile memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations41
US9502413B2Nov 22, 2016
Semiconductor devices including raised source/drain stressors and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations36
MAEDA SHIGENOBU
4 patentsUS8836046B2Sep 16, 2014
Semiconductor devices including protruding insulation portions between active fins
MAEDA SHIGENOBU19 citations92
US9536881B2Jan 3, 2017
Semiconductor devices having fin shaped channels
MAEDA SHIGENOBU4 citations73
US9419077B2Aug 16, 2016
Semiconductor devices including protruding insulation portions between active fins
MAEDA SHIGENOBU1 citations62
US9627483B2Apr 18, 2017
Semiconductor devices including protruding insulation portions between active fins
MAEDA SHIGENOBU0 citations52