Inventor · disambiguated record
Po-Chin Nien
Also filed as: NIEN PO-CHIN
9 granted patents·3 pending applications·6 citations·filing 2013–2024
78Inventor score
Top patents by PatentIndex Score
12 records- 0182US9871115B1Doped poly-silicon for polyCMP planarity improvementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 16, 2018·3 cites·20 claims
- 0274US2024412977A1System and method for removing impurities during chemical mechanical planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0365US10541139B2Planarization control in semiconductor manufacturing processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 21, 2020·1 cites·20 claims
- 0464US9721831B2Method and apparatus for semiconductor planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 1, 2017·1 cites·20 claims
- 0563US12293917B2System and method for removing impurities during chemical mechanical planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted May 6, 2025·0 cites·21 claims
- 0661US9354198B2Calibration method, test strip and calibration system for blood glucose of blood sampleDELBIO INC·Filed 2013·Granted May 31, 2016·1 cites·4 claims
- 0753US10068988B2Doped poly-silicon for PolyCMP planarity improvementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 4, 2018·0 cites·20 claims
- 0849US2023154762A1Semiconductor Device and Method of Forming the SameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 0947US11189497B2Chemical mechanical planarization using nano-abrasive slurryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 30, 2021·0 cites·20 claims
- 1044US9941109B2Surface treatment in a chemical mechanical processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 10, 2018·0 cites·20 claims
- 1142US9922837B2Asymmetric application of pressure to a wafer during a CMP processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 20, 2018·0 cites·17 claims
- 1238US2015034499A1Determination methodsDELBIO INC·Filed 2014·Application pending·0 cites
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