Inventor
SHIH MENG-CHUN
TW22 patents
Patents
22 patentsUS10877089B2Dec 29, 2020
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10665321B2May 26, 2020
Method for testing MRAM device and test apparatus thereof
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations72
US11429482B2Aug 30, 2022
Systems and methods for correcting data errors in memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10936413B2Mar 2, 2021
Systems and methods for correcting data errors in memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10228998B2Mar 12, 2019
Systems and methods for correcting data errors in memory susceptible to data loss when subjected to elevated temperatures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12210055B2Jan 28, 2025
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12191262B2Jan 7, 2025
Package structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12040036B2Jul 16, 2024
Magnetic memory device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11837312B1Dec 5, 2023
Magnetic memory device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11749617B2Sep 5, 2023
Package structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11726062B2Aug 15, 2023
Magnetic layer characterization system and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11719742B2Aug 8, 2023
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11506706B2Nov 22, 2022
Semiconductor wafer testing system and related method for improving external magnetic field wafer testing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11380626B2Jul 5, 2022
Package structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11276649B2Mar 15, 2022
Devices and methods having magnetic shielding layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11755410B2Sep 12, 2023
Systems and methods for correcting data errors in memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11726747B2Aug 15, 2023
Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11531524B2Dec 20, 2022
Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11249131B2Feb 15, 2022
Test apparatus and testing method using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10818609B2Oct 27, 2020
Package structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10176998B2Jan 8, 2019
Semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10128313B2Nov 13, 2018
Non-volatile memory device and structure thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations49