P

Inventor

LICAUSI NICHOLAS V

US35 patents
⚠️ This page may combine multiple inventors who share the name “LICAUSI NICHOLAS V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

25 patents
US8846491B1Sep 30, 2014

Forming a diffusion break during a RMG process

GLOBALFOUNDRIES INC97 citations97
US10475692B2Nov 12, 2019

Self aligned buried power rail

GLOBALFOUNDRIES INC14 citations94
US10177028B1Jan 8, 2019

Method for manufacturing fully aligned via structures having relaxed gapfills

GLOBALFOUNDRIES INC44 citations94
US8691640B1Apr 8, 2014

Methods of forming dielectrically isolated fins for a FinFET semiconductor by performing an etching process wherein the etch rate is modified via inclusion of a dopant material

GLOBALFOUNDRIES INC33 citations93
US10304833B1May 28, 2019

Method of forming complementary nano-sheet/wire transistor devices with same depth contacts

GLOBALFOUNDRIES INC19 citations86
US9530654B2Dec 27, 2016

FINFET fin height control

GLOBALFOUNDRIES INC8 citations84
US9318388B2Apr 19, 2016

Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devices

GLOBALFOUNDRIES INC9 citations82
US9093302B2Jul 28, 2015

Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devices

GLOBALFOUNDRIES INC10 citations82
US10109526B1Oct 23, 2018

Etch profile control during skip via formation

GLOBALFOUNDRIES INC9 citations80
US10366919B2Jul 30, 2019

Fully aligned via in ground rule region

GLOBALFOUNDRIES INC2 citations73
US10134580B1Nov 20, 2018

Metallization levels and methods of making thereof

GLOBALFOUNDRIES INC6 citations73
US10770392B1Sep 8, 2020

Line end structures for semiconductor devices

GLOBALFOUNDRIES INC3 citations72
US10707119B1Jul 7, 2020

Interconnect structures with airgaps and dielectric-capped interconnects

GLOBALFOUNDRIES INC3 citations72
US10580696B1Mar 3, 2020

Interconnects formed by a metal displacement reaction

GLOBALFOUNDRIES INC3 citations72
US10818494B2Oct 27, 2020

Metal on metal multiple patterning

GLOBALFOUNDRIES INC2 citations71
US10485111B2Nov 19, 2019

Via and skip via structures

GLOBALFOUNDRIES INC2 citations71
US10677855B2Jun 9, 2020

Structure, method and system for measuring RIE lag depth

GLOBALFOUNDRIES INC1 citations62
US11398378B2Jul 26, 2022

Metal on metal multiple patterning

GLOBALFOUNDRIES INC0 citations61
US10199261B1Feb 5, 2019

Via and skip via structures

GLOBALFOUNDRIES INC1 citations61
US10832944B2Nov 10, 2020

Interconnect structure having reduced resistance variation and method of forming same

GLOBALFOUNDRIES INC0 citations52
US10283372B2May 7, 2019

Interconnects formed by a metal replacement process

GLOBALFOUNDRIES INC0 citations52
US9570394B1Feb 14, 2017

Formation of IC structure with pair of unitary metal fins

GLOBALFOUNDRIES INC1 citations52
US8889549B2Nov 18, 2014

Methods of forming conductive structures using a sacrificial liner layer

GLOBALFOUNDRIES INC0 citations52
US8846511B2Sep 30, 2014

Methods of trimming nanowire structures

GLOBALFOUNDRIES INC0 citations51
US10622266B2Apr 14, 2020

Methods of identifying space within integrated circuit structure as mandrel space or non-mandrel space

GLOBALFOUNDRIES INC0 citations33

GLOBALFOUNDRIES US INC

4 patents

MASZARA WITOLD P

2 patents

LICAUSI NICHOLAS V

2 patents

IBM

1 patent

PSIQUANTUM CORP

1 patent