P

Inventor

CHEN KUEI-MING

TW22 patents
⚠️ This page may combine multiple inventors who share the name “CHEN KUEI-MING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

20 patents
US10014402B1Jul 3, 2018

High electron mobility transistor (HEMT) device structure

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US11923237B2Mar 5, 2024

Manufacturing method of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11515408B2Nov 29, 2022

Rough buffer layer for group III-V devices on silicon

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11222849B2Jan 11, 2022

Substrate loss reduction for semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9818858B1Nov 14, 2017

Multi-layer active layer having a partial recess

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10068976B2Sep 4, 2018

Enhancement mode field-effect transistor with a gate dielectric layer recessed on a composite barrier layer for high static performance

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12598775B2Apr 7, 2026

Source/drains in semiconductor devices and methods of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12439662B2Oct 7, 2025

Diffusion barrier layer for source and drain structures to increase transistor performance

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12426295B2Sep 23, 2025

Rough buffer layer for group III-V devices on silicon

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12389633B2Aug 12, 2025

Source/drains in semiconductor devices and methods of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12334389B2Jun 17, 2025

Manufacturing method of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12278139B2Apr 15, 2025

Manufacturing method of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12255232B2Mar 18, 2025

Gallium nitride drain structures and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12148706B2Nov 19, 2024

Substrate loss reduction for semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11901413B2Feb 13, 2024

Diffusion barrier layer for source and drain structures to increase transistor performance

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11862720B2Jan 2, 2024

Rough buffer layer for group III-V devices on silicon

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11824099B2Nov 21, 2023

Source/drains in semiconductor devices and methods of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11652058B2May 16, 2023

Substrate loss reduction for semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11522049B2Dec 6, 2022

Diffusion barrier layer for source and drain structures to increase transistor performance

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12506089B2Dec 23, 2025

Semiconductor structures with improved reliability

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61

LEE WEI-I

2 patents