Inventor
AJIMA TAKASHI
JP17 patents
⚠️ This page may combine multiple inventors who share the name “AJIMA TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO SHIBAURA ELECTRIC CO
15 patentsUS4520041AMay 28, 1985
Method for forming metallization structure having flat surface on semiconductor substrate
TOKYO SHIBAURA ELECTRIC CO65 citations96
US4853760AAug 1, 1989
Semiconductor device having insulating layer including polyimide film
TOKYO SHIBAURA ELECTRIC CO36 citations92
US4636832AJan 13, 1987
Semiconductor device with an improved bonding section
TOKYO SHIBAURA ELECTRIC CO41 citations92
US4161743AJul 17, 1979
Semiconductor device with silicon carbide-glass-silicon carbide passivating overcoat
TOKYO SHIBAURA ELECTRIC CO49 citations91
US4351894ASep 28, 1982
Method of manufacturing a semiconductor device using silicon carbide mask
TOKYO SHIBAURA ELECTRIC CO24 citations81
US4479830AOct 30, 1984
Method of manufacturing a semiconductor device using epitaxially regrown protrusion as an alignment marker
TOKYO SHIBAURA ELECTRIC CO9 citations74
US4462856AJul 31, 1984
System for etching a metal film on a semiconductor wafer
TOKYO SHIBAURA ELECTRIC CO10 citations74
US4415372ANov 15, 1983
Method of making transistors by ion implantations, electron beam irradiation and thermal annealing
TOKYO SHIBAURA ELECTRIC CO7 citations74
US4560642ADec 24, 1985
Method of manufacturing a semiconductor device
TOKYO SHIBAURA ELECTRIC CO8 citations72
US4224636ASep 23, 1980
Semiconductor device with thermally compensating SiO2 -silicate glass-SiC passivation layer
TOKYO SHIBAURA ELECTRIC CO9 citations72
US4123564AOct 31, 1978
Method of producing semiconductor device
TOKYO SHIBAURA ELECTRIC CO13 citations72
US4146413AMar 27, 1979
Method of producing a P-N junction utilizing polycrystalline silicon
TOKYO SHIBAURA ELECTRIC CO16 citations69
US4426234AJan 17, 1984
Method of forming reproducible impurity zone of gallium or aluminum in a wafer by implanting through composite layers and diffusion annealing
TOKYO SHIBAURA ELECTRIC CO6 citations63
US4404736ASep 20, 1983
Method for manufacturing a semiconductor device of mesa type
TOKYO SHIBAURA ELECTRIC CO3 citations63
US4515642AMay 7, 1985
Method of forming deep aluminum doped silicon by implanting Al and Si ions through alumina layer and device formed thereby
TOKYO SHIBAURA ELECTRIC CO3 citations62