P

Inventor

AJIMA TAKASHI

JP17 patents
⚠️ This page may combine multiple inventors who share the name “AJIMA TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO SHIBAURA ELECTRIC CO

15 patents
US4520041AMay 28, 1985

Method for forming metallization structure having flat surface on semiconductor substrate

TOKYO SHIBAURA ELECTRIC CO65 citations96
US4853760AAug 1, 1989

Semiconductor device having insulating layer including polyimide film

TOKYO SHIBAURA ELECTRIC CO36 citations92
US4636832AJan 13, 1987

Semiconductor device with an improved bonding section

TOKYO SHIBAURA ELECTRIC CO41 citations92
US4161743AJul 17, 1979

Semiconductor device with silicon carbide-glass-silicon carbide passivating overcoat

TOKYO SHIBAURA ELECTRIC CO49 citations91
US4351894ASep 28, 1982

Method of manufacturing a semiconductor device using silicon carbide mask

TOKYO SHIBAURA ELECTRIC CO24 citations81
US4479830AOct 30, 1984

Method of manufacturing a semiconductor device using epitaxially regrown protrusion as an alignment marker

TOKYO SHIBAURA ELECTRIC CO9 citations74
US4462856AJul 31, 1984

System for etching a metal film on a semiconductor wafer

TOKYO SHIBAURA ELECTRIC CO10 citations74
US4415372ANov 15, 1983

Method of making transistors by ion implantations, electron beam irradiation and thermal annealing

TOKYO SHIBAURA ELECTRIC CO7 citations74
US4560642ADec 24, 1985

Method of manufacturing a semiconductor device

TOKYO SHIBAURA ELECTRIC CO8 citations72
US4224636ASep 23, 1980

Semiconductor device with thermally compensating SiO2 -silicate glass-SiC passivation layer

TOKYO SHIBAURA ELECTRIC CO9 citations72
US4123564AOct 31, 1978

Method of producing semiconductor device

TOKYO SHIBAURA ELECTRIC CO13 citations72
US4146413AMar 27, 1979

Method of producing a P-N junction utilizing polycrystalline silicon

TOKYO SHIBAURA ELECTRIC CO16 citations69
US4426234AJan 17, 1984

Method of forming reproducible impurity zone of gallium or aluminum in a wafer by implanting through composite layers and diffusion annealing

TOKYO SHIBAURA ELECTRIC CO6 citations63
US4404736ASep 20, 1983

Method for manufacturing a semiconductor device of mesa type

TOKYO SHIBAURA ELECTRIC CO3 citations63
US4515642AMay 7, 1985

Method of forming deep aluminum doped silicon by implanting Al and Si ions through alumina layer and device formed thereby

TOKYO SHIBAURA ELECTRIC CO3 citations62

TOSHIBA KK

2 patents