Inventor

LEE GEUN-IL

KR49 patents

⚠️ This page may combine multiple inventors who share the name “LEE GEUN-IL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE GEUN-IL

HYNIX SEMICONDUCTOR INC

On-die termination device

Magnetic random access memory

Termination circuit and impedance matching device including the same

Nonvolatile ferroelectric memory device and method of fabricating the same

Ferroelectric memory and method for driving the same

Data output circuit

Parallel-to-serial converting circuit

High voltage generation circuit

Magneto-resistive random access memory

Nonvolatile ferroelectric memory device and method for driving the same

Nonvolatile ferroelectric memory and method for driving the same

On-die termination circuit

Data output clock generating circuit and method of generating data output clock of semiconductor memory apparatus

Magnetic random access memory

Nonvolatile ferroelectric memory device and method for driving the same

Semiconductor memory device including global IO line with low-amplitude driving voltage signal applied thereto

Data latch controller of synchronous memory device

Data latch controller of synchronous memory device

Method for detecting column fail by controlling sense amplifier of memory device

Data latch circuit and semiconductor device using the same

Ferroelectric memory device and a method for driving the same

Circuit for testing ferroelectric capacitor in FRAM

Memory device capable of detecting its failure

Semiconductor memory apparatus

Data output clock generating circuit and method of generating data output clock of semiconductor memory apparatus

Memory device capable of detecting its failure

Method and apparatus for masking postamble ringing phenomenon in DDR SDRAM

Apparatus and method for driving ferroelectric memory

Memory chip architecture with high speed operation

Internal clock generator

SK HYNIX INC

Semiconductor memory device for performing refresh operation and operating method therof

Clock distribution circuit and semiconductor device including the clock distribution circuit

Semiconductor apparatus

Semiconductor memory device and semiconductor system including the same

Refresh circuit and semiconductor memory device including the same

Semiconductor apparatus related to receiving clock signals having variable frequencies, and system including the semiconductor apparatus

Semiconductor memory device for performing both of static test and dynamic test during wafer burn-in test and method for operating the same

Semiconductor device and semiconductor system

Data transmission circuit and data transmission / reception system

Semiconductor apparatus capable of improving efficiency for a circuit configuration and a signal line interconnection

Clock generation circuit and clock generation system using the same

Operation control circuit and semiconductor memory device including the operation control circuit

Semiconductor device and operation method thereof

Semiconductor apparatus and test system including the semiconductor apparatus

LEE GEUN-IL

Data transmission circuit and data transmission/reception system with reduced jitter

On-die termination device

Data transferring circuit and data transferring/receiving system

Semiconductor device

LEE GEUN IL

Impedance control signal generation circuit and impedance control method of semiconductor circuit