Inventor
NIGH PHILLIP J
US18 patents
⚠️ This page may combine multiple inventors who share the name “NIGH PHILLIP J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
16 patentsUS6442723B1Aug 27, 2002
Logic built-in self test selective signature generation
IBM84 citations97
US6961886B2Nov 1, 2005
Diagnostic method for structural scan chain designs
IBM59 citations96
US6516432B1Feb 4, 2003
AC scan diagnostic method
IBM103 citations96
US6618682B2Sep 9, 2003
Method for test optimization using historical and actual fabrication test data
IBM88 citations95
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US5930270AJul 27, 1999
Logic built in self-test diagnostic method
IBM41 citations90
US6650768B1Nov 18, 2003
Using time resolved light emission from VLSI circuit devices for navigation on complex systems
IBM20 citations89
US6998866B1Feb 14, 2006
Circuit and method for monitoring defects
IBM13 citations83
US7017095B2Mar 21, 2006
Functional pattern logic diagnostic method
IBM15 citations81
US7574644B2Aug 11, 2009
Functional pattern logic diagnostic method
IBM15 citations77
US6751765B1Jun 15, 2004
Method and system for determining repeatable yield detractors of integrated circuits
IBM10 citations69
US6650130B1Nov 18, 2003
Integrated circuit device defect detection method and apparatus employing light emission imaging
IBM12 citations68
US7127690B2Oct 24, 2006
Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearity
IBM6 citations62
US6125461ASep 26, 2000
Method for identifying long paths in integrated circuits
IBM6 citations57
US6763314B2Jul 13, 2004
AC defect detection and failure avoidance power up and diagnostic system
IBM0 citations51
US7089514B2Aug 8, 2006
Defect diagnosis for semiconductor integrated circuits
IBM1 citations48