Inventor
STEPHENS TAB A
US35 patents
⚠️ This page may combine multiple inventors who share the name “STEPHENS TAB A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
28 patentsUS7504302B2Mar 17, 2009
Process of forming a non-volatile memory cell including a capacitor structure
FREESCALE SEMICONDUCTOR INC241 citations99
US7015517B2Mar 21, 2006
Semiconductor device incorporating a defect controlled strained channel structure and method of making the same
FREESCALE SEMICONDUCTOR INC92 citations97
US6919258B2Jul 19, 2005
Semiconductor device incorporating a defect controlled strained channel structure and method of making the same
FREESCALE SEMICONDUCTOR INC104 citations97
US6831350B1Dec 14, 2004
Semiconductor structure with different lattice constant materials and method for forming the same
FREESCALE SEMICONDUCTOR INC89 citations97
US9094135B2Jul 28, 2015
Die stack with optical TSVs
FREESCALE SEMICONDUCTOR INC19 citations93
US7339241B2Mar 4, 2008
FinFET structure with contacts
FREESCALE SEMICONDUCTOR INC42 citations93
US7091071B2Aug 15, 2006
Semiconductor fabrication process including recessed source/drain regions in an SOI wafer
FREESCALE SEMICONDUCTOR INC22 citations92
US6951783B2Oct 4, 2005
Confined spacers for double gate transistor semiconductor fabrication process
FREESCALE SEMICONDUCTOR INC23 citations91
US9810843B2Nov 7, 2017
Optical backplane mirror
FREESCALE SEMICONDUCTOR INC8 citations84
US9435952B2Sep 6, 2016
Integration of a MEMS beam with optical waveguide and deflection in two dimensions
FREESCALE SEMICONDUCTOR INC14 citations84
US9261556B2Feb 16, 2016
Optical wafer and die probe testing
FREESCALE SEMICONDUCTOR INC7 citations84
US9091820B2Jul 28, 2015
Communication system die stack
FREESCALE SEMICONDUCTOR INC8 citations84
US7491630B2Feb 17, 2009
Undoped gate poly integration for improved gate patterning and cobalt silicide extendibility
FREESCALE SEMICONDUCTOR INC11 citations84
US7910482B2Mar 22, 2011
Method of forming a finFET and structure
FREESCALE SEMICONDUCTOR INC11 citations80
US9766409B2Sep 19, 2017
Optical redundancy
FREESCALE SEMICONDUCTOR INC2 citations73
US7829447B2Nov 9, 2010
Semiconductor structure pattern formation
FREESCALE SEMICONDUCTOR INC7 citations73
US7235471B2Jun 26, 2007
Method for forming a semiconductor device having a silicide layer
FREESCALE SEMICONDUCTOR INC8 citations73
US7659156B2Feb 9, 2010
Method to selectively modulate gate work function through selective Ge condensation and high-K dielectric layer
FREESCALE SEMICONDUCTOR INC5 citations72
US9070653B2Jun 30, 2015
Microelectronic assembly having a heat spreader for a plurality of die
FREESCALE SEMICONDUCTOR INC3 citations63
US8980734B2Mar 17, 2015
Gate security feature
FREESCALE SEMICONDUCTOR INC3 citations63
US7208424B2Apr 24, 2007
Method of forming a semiconductor device having a metal layer
FREESCALE SEMICONDUCTOR INC6 citations62
US7074713B2Jul 11, 2006
Plasma enhanced nitride layer
FREESCALE SEMICONDUCTOR INC6 citations62
US7132327B2Nov 7, 2006
Decoupled complementary mask patterning transfer method
FREESCALE SEMICONDUCTOR INC2 citations60
US9431380B2Aug 30, 2016
Microelectronic assembly having a heat spreader for a plurality of die
FREESCALE SEMICONDUCTOR INC0 citations52
US7911002B2Mar 22, 2011
Semiconductor device with selectively modulated gate work function
FREESCALE SEMICONDUCTOR INC1 citations51
US7566623B2Jul 28, 2009
Electronic device including a semiconductor fin having a plurality of gate electrodes and a process for forming the electronic device
FREESCALE SEMICONDUCTOR INC1 citations51
US10230458B2Mar 12, 2019
Optical die test interface with separate voltages for adjacent electrodes
FREESCALE SEMICONDUCTOR INC0 citations42
US7745298B2Jun 29, 2010
Method of forming a via
FREESCALE SEMICONDUCTOR INC0 citations41
MCSHANE MICHAEL B
3 patentsUS9099475B2Aug 4, 2015
Techniques for reducing inductance in through-die vias of an electronic assembly
MCSHANE MICHAEL B2 citations61
US8680674B2Mar 25, 2014
Methods and structures for reducing heat exposure of thermally sensitive semiconductor devices
MCSHANE MICHAEL B3 citations61
US9093429B2Jul 28, 2015
Methods and structures for reducing heat exposure of thermally sensitive semiconductor devices
MCSHANE MICHAEL B1 citations50