P

Inventor

STEPHENS TAB A

US35 patents
⚠️ This page may combine multiple inventors who share the name “STEPHENS TAB A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FREESCALE SEMICONDUCTOR INC

28 patents
US7504302B2Mar 17, 2009

Process of forming a non-volatile memory cell including a capacitor structure

FREESCALE SEMICONDUCTOR INC241 citations99
US7015517B2Mar 21, 2006

Semiconductor device incorporating a defect controlled strained channel structure and method of making the same

FREESCALE SEMICONDUCTOR INC92 citations97
US6919258B2Jul 19, 2005

Semiconductor device incorporating a defect controlled strained channel structure and method of making the same

FREESCALE SEMICONDUCTOR INC104 citations97
US6831350B1Dec 14, 2004

Semiconductor structure with different lattice constant materials and method for forming the same

FREESCALE SEMICONDUCTOR INC89 citations97
US9094135B2Jul 28, 2015

Die stack with optical TSVs

FREESCALE SEMICONDUCTOR INC19 citations93
US7339241B2Mar 4, 2008

FinFET structure with contacts

FREESCALE SEMICONDUCTOR INC42 citations93
US7091071B2Aug 15, 2006

Semiconductor fabrication process including recessed source/drain regions in an SOI wafer

FREESCALE SEMICONDUCTOR INC22 citations92
US6951783B2Oct 4, 2005

Confined spacers for double gate transistor semiconductor fabrication process

FREESCALE SEMICONDUCTOR INC23 citations91
US9810843B2Nov 7, 2017

Optical backplane mirror

FREESCALE SEMICONDUCTOR INC8 citations84
US9435952B2Sep 6, 2016

Integration of a MEMS beam with optical waveguide and deflection in two dimensions

FREESCALE SEMICONDUCTOR INC14 citations84
US9261556B2Feb 16, 2016

Optical wafer and die probe testing

FREESCALE SEMICONDUCTOR INC7 citations84
US9091820B2Jul 28, 2015

Communication system die stack

FREESCALE SEMICONDUCTOR INC8 citations84
US7491630B2Feb 17, 2009

Undoped gate poly integration for improved gate patterning and cobalt silicide extendibility

FREESCALE SEMICONDUCTOR INC11 citations84
US7910482B2Mar 22, 2011

Method of forming a finFET and structure

FREESCALE SEMICONDUCTOR INC11 citations80
US9766409B2Sep 19, 2017

Optical redundancy

FREESCALE SEMICONDUCTOR INC2 citations73
US7829447B2Nov 9, 2010

Semiconductor structure pattern formation

FREESCALE SEMICONDUCTOR INC7 citations73
US7235471B2Jun 26, 2007

Method for forming a semiconductor device having a silicide layer

FREESCALE SEMICONDUCTOR INC8 citations73
US7659156B2Feb 9, 2010

Method to selectively modulate gate work function through selective Ge condensation and high-K dielectric layer

FREESCALE SEMICONDUCTOR INC5 citations72
US9070653B2Jun 30, 2015

Microelectronic assembly having a heat spreader for a plurality of die

FREESCALE SEMICONDUCTOR INC3 citations63
US8980734B2Mar 17, 2015

Gate security feature

FREESCALE SEMICONDUCTOR INC3 citations63
US7208424B2Apr 24, 2007

Method of forming a semiconductor device having a metal layer

FREESCALE SEMICONDUCTOR INC6 citations62
US7074713B2Jul 11, 2006

Plasma enhanced nitride layer

FREESCALE SEMICONDUCTOR INC6 citations62
US7132327B2Nov 7, 2006

Decoupled complementary mask patterning transfer method

FREESCALE SEMICONDUCTOR INC2 citations60
US9431380B2Aug 30, 2016

Microelectronic assembly having a heat spreader for a plurality of die

FREESCALE SEMICONDUCTOR INC0 citations52
US7911002B2Mar 22, 2011

Semiconductor device with selectively modulated gate work function

FREESCALE SEMICONDUCTOR INC1 citations51
US7566623B2Jul 28, 2009

Electronic device including a semiconductor fin having a plurality of gate electrodes and a process for forming the electronic device

FREESCALE SEMICONDUCTOR INC1 citations51
US10230458B2Mar 12, 2019

Optical die test interface with separate voltages for adjacent electrodes

FREESCALE SEMICONDUCTOR INC0 citations42
US7745298B2Jun 29, 2010

Method of forming a via

FREESCALE SEMICONDUCTOR INC0 citations41

MCSHANE MICHAEL B

3 patents

PELLEY PERRY H

2 patents

MATHEW LEO

1 patent

PHAM TIM V

1 patent